Search results for "henard_ICST_13", found 1 papers, 1 pages
1 | Christopher Henard and Mike Papadakis and Gilles Perrouin and Jacques Klein and Yves Le Traon Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013 Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013, 2013. |
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Abstract: Available soon... | |
@INPROCEEDINGS{henard_ICST_13,
author = {Christopher Henard and Mike Papadakis and Gilles Perrouin and Jacques Klein and Yves Le Traon},
title = {Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing},
booktitle = {Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013 Workshops Proceedings, Luxembourg, Luxembourg, March 18-22, 2013},
year = {2013},
address = {},
month = {},
pages = {188--197}
} |