Mutation Testing Publications
Search results for "LoiseDPPH17", found 1 papers, 1 pages
| 1 | Thomas Loise and Xavier Devroey and Gilles Perrouin and Mike Papadakis and Patrick Heymans Towards Security-Aware Mutation Testing 2017 {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March 13-17, 2017, 2017. |
| BibTeX | Abstract | PDF | DOI | |
| Abstract: Available soon... | |
@INPROCEEDINGS{LoiseDPPH17,
author = {Thomas Loise and Xavier Devroey and Gilles Perrouin and Mike Papadakis and Patrick Heymans},
title = {Towards Security-Aware Mutation Testing},
booktitle = {2017 {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March 13-17, 2017},
year = {2017},
address = {},
month = {},
pages = {97--102}
} |