| 741 | Elaine Jessica Weyuker and T. Goradia and A. Singh
Automatically Generating Test Data from a Boolean Specification
IEEE Transactions on Software Engineering, 20(5), May 1994. |
|
| | Abstract: This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared. |
| | @ARTICLE{WeyukerGS94,
author = {Elaine Jessica Weyuker and T. Goradia and A. Singh},
title = {Automatically Generating Test Data from a Boolean Specification},
journal = {IEEE Transactions on Software Engineering},
year = {1994},
month = {May},
volume = {20},
number = {5},
pages = {353-363}
} |
| 742 | Aditya P. Mathur and W. Eric Wong
A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria
Proceedings of the 22nd annual ACM Computer Science Conference on Scaling UpPhoenix, Arizona, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MathurW94a,
author = {Aditya P. Mathur and W. Eric Wong},
title = {A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria},
booktitle = {Proceedings of the 22nd annual ACM Computer Science Conference on Scaling Up},
year = {1994},
address = {Phoenix, Arizona},
month = {},
pages = {38-45}
} |
| 743 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan
Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLMJH94,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan},
title = {Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {230-238}
} |
| 744 | S.C. Pinto Ferraz Fabbri and Marcio Eduardo Delamaro and Jose Carlos Maldonado and P.C. Masiero
Mutation Analysis Testing for Finite State Machines
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{FabbriDMM94,
author = {S.C. Pinto Ferraz Fabbri and Marcio Eduardo Delamaro and Jose Carlos Maldonado and P.C. Masiero},
title = {Mutation Analysis Testing for Finite State Machines},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {220-229}
} |
| 745 | A. Jefferson Offutt
A Practical System for Mutation Testing: Help for the Common Programmer
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years, 2-6 October 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Offutt94,
author = {A. Jefferson Offutt},
title = {A Practical System for Mutation Testing: Help for the Common Programmer},
booktitle = {Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years},
year = {1994},
address = {},
month = {2-6 October},
pages = {824-830}
} |
| 746 | Aditya P. Mathur
Mutation Testing
Encyclopedia of Software Engineering, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{EncyclopediaSE,
author = {Aditya P. Mathur},
title = {Mutation Testing},
booktitle = {Encyclopedia of Software Engineering},
year = {1994},
address = {},
month = {},
pages = {707–713}
} |
| 747 | A. Jefferson Offutt and W. M. Craft
Using Compiler Optimization Techniques to Detect Equivalent Mutants
Software Testing, Verification and Reliability, 4(3), September 1994. |
|
| | Abstract: Mutation analysis is a software testing technique that requires the tester to generate test data that will find specific, well-defined errors. Mutation testing executes many slightly differing versions, called mutants, of the same program to evaluate the quality of the data used to test the program. Although these mutants are generated and executed efficiently by automated methods, many of the mutants are functionally equivalent to the original program and are not useful for testing. Recognizing and eliminating equivalent mutants is currently done by hand, a time-consuming and arduous task. This problem is currently a major obstacle to the practical application of mutation testing.
This paper presents extensions to previous work in detecting equivalent mutants; specifically, algorithms for determining several classes of equivalent mutants are presented, an implementation of these algorithms is discussed, and results from using this implementation are presented. These algorithms are based on data flow analysis and six compiler optimization techniques. Each of these techniques is described together with how they are used to detect equivalent mutants. The design of the tool and some experimental results using it are also presented. |
| | @ARTICLE{OffuttC94,
author = {A. Jefferson Offutt and W. M. Craft},
title = {Using Compiler Optimization Techniques to Detect Equivalent Mutants},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {September},
volume = {4},
number = {3},
pages = {131-154}
} |
| 748 | A. Jefferson Offutt and Zhenyi Jin and Jie Pan
The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms
George Mason UniversityISSE-TR-94-110, Fairfax, Virginia, 1994. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{OffuttJP94,
author = {A. Jefferson Offutt and Zhenyi Jin and Jie Pan},
title = {The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms},
institution = {George Mason University},
year = {1994},
type = {techreport},
number = {ISSE-TR-94-110},
address = {Fairfax, Virginia},
month = {},
} |
| 749 | Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur
A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing
Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection, 25-26 April 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloTM94,
author = {Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur},
title = {A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing},
booktitle = {Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection},
year = {1994},
address = {},
month = {25-26 April},
pages = {54-56}
} |
| 750 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria
Software Testing, Verification and Reliability, 4(1), 1994. |
|
| | Abstract: Evaluation of the adequacy of a test set consisting of one or more test cases is a problem oftes encountered in software testing environments. Two test adequacy criiteria are considered, namely the data flow based all-uses criterion and a mutation based criterion. An empirical study was conducted to compare the difficulty of satisfying the two criteria and their costs. Similar studies conducted in the past are discussed in the light of this study. A discussion is also presented of how and why the results of this study, when viewed in conjunction with the results of earlier comparisons of testing methods, are useful to a software test team. |
| | @ARTICLE{MathurW94,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {},
volume = {4},
number = {1},
pages = {9 - 31}
} |
