Mutation Testing Publications

Search results for "all papers", found 857 papers, 86 pages

61Ali Parsai and Alessandro Murgia and Serge Demeyer
A Model to Estimate First-Order Mutation Coverage from Higher-Order Mutation Coverage
2016 {IEEE} International Conference on Software Quality, Reliability and Security, {QRS} 2016, Vienna, Austria, August 1-3, 2016, 2016.
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62Vincenzo Musco and Martin Monperrus and Philippe Preux
Mutation-Based Graph Inference for Fault Localization
16th {IEEE} International Working Conference on Source Code Analysis and Manipulation, {SCAM} 2016, Raleigh, NC, USA, October 2-3, 2016, 2016.
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63Willem Visser
What makes killing a mutant hard
Proceedings of the 31st {IEEE/ACM} International Conference on Automated Software Engineering, {ASE} 2016, Singapore, September 3-7, 2016, 2016.
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64Dan Hao and Lu Zhang and Lei Zang and Yanbo Wang and Xingxia Wu and Tao Xie
To Be Optimal or Not in Test-Case Prioritization
{IEEE} Trans. Software Eng., 42(5), 2016.
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65Everton L. G. Alves and Patr{\'{\i}}cia D. L. Machado and Tiago Massoni and Miryung Kim
Prioritizing test cases for early detection of refactoring faults
Softw. Test., Verif. Reliab., 26(5), 2016.
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66Fevzi Belli and Christof J. Budnik and Axel Hollmann and Tugkan Tuglular and W. Eric Wong
Model-based mutation testing - Approach and case studies
Sci. Comput. Program., 120(), 2016.
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67Francisco Carlos M. Souza and Mike Papadakis and Yves Le Traon and M{\'{a}}rcio Eduardo Delamaro
Strong mutation-based test data generation using hill climbing
Proceedings of the 9th International Workshop on Search-Based Software Testing, SBST@ICSE 2016, Austin, Texas, USA, May 14-22, 2016, 2016.
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68Upsorn Praphamontripong and Jeff Offutt and Lin Deng and Jingjing Gu
An Experimental Evaluation of Web Mutation Operators
Ninth {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2016, Chicago, IL, USA, April 11-15, 2016, 2016.
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69Hiroaki Yoshida and Susumu Tokumoto and Mukul R. Prasad and Indradeep Ghosh and Tadahiro Uehara
{FSX:} a tool for fine-grained incremental unit test generation for {C/C++} programs
Proceedings of the 24th {ACM} {SIGSOFT} International Symposium on Foundations of Software Engineering, {FSE} 2016, Seattle, WA, USA, November 13-18, 2016, 2016.
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70Javier Tuya and Claudio de la Riva and Mar{\'{\i}}a Jos{\'{e}} Su{\'{a}}rez Cabal and Raquel Blanco
Coverage-Aware Test Database Reduction
{IEEE} Trans. Software Eng., 42(10), 2016.
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