| 661 | A. Jefferson Offutt and Roland Untch
{Mutation 2000}: {Uniting} the Orthogonal
{Mutation 2000}San Jose, California, USA, #Oct# 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{offutt:mutation2000,
author = {A. Jefferson Offutt and Roland Untch},
title = {{Mutation 2000}: {Uniting} the Orthogonal},
booktitle = {{Mutation 2000}},
year = {2001},
address = {San Jose, California, USA},
month = {#Oct#},
pages = {45--55}
} |
| 662 | Timothy K. Tsai and Navjot Singh
How Reliable Is Your NT Application?: Using Fault Injection to Test Critical Applications
Unknown- |
|
| | Abstract: Available soon... |
| | Unknown++ |
| 663 | Simone Do Rocio Senger De Souza and Jose Carlos Maldonado and Sandra Camargo Pinto Ferraz Fabbri and Wanderley Lopes De Souza
Mutation Testing Applied to Estelle Specifications
Proceedings of the 33rd Hawaii International Conference on System Sciences (HICSS'08)Maui, Hawaii, 4-7 January 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{SouzaMFS00,
author = {Simone Do Rocio Senger De Souza and Jose Carlos Maldonado and Sandra Camargo Pinto Ferraz Fabbri and Wanderley Lopes De Souza},
title = {Mutation Testing Applied to Estelle Specifications},
booktitle = {Proceedings of the 33rd Hawaii International Conference on System Sciences (HICSS'08)},
year = {2000},
address = {Maui, Hawaii},
month = {4-7 January},
pages = {8011}
} |
| 664 | Sudipto Ghosh and Aditya P. Mathur
Interface Mutation to Assess the Adequacy of Tests for Componentsand Systems
Proceedings of the 34th International Conference on Technology of Object-Oriented Languages and Systems (TOOLS'00)Santa Barbara, California, 30 July - 4 August 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{GhoshM00,
author = {Sudipto Ghosh and Aditya P. Mathur},
title = {Interface Mutation to Assess the Adequacy of Tests for Componentsand Systems},
booktitle = {Proceedings of the 34th International Conference on Technology of Object-Oriented Languages and Systems (TOOLS'00)},
year = {2000},
address = {Santa Barbara, California},
month = {30 July - 4 August},
pages = {37}
} |
| 665 | Wei Ding
Using Mutation to Generate Tests from Specifications
George Mason University, Fairfax, VA, 2000. |
|
| | Abstract: Available soon... |
| | @MASTERSTHESIS{Ding00,
author = {Wei Ding},
title = {Using Mutation to Generate Tests from Specifications},
school = {George Mason University},
year = {2000},
type = {mastersthesis},
address = {Fairfax, VA},
month = {},
} |
| 666 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur
Interface Mutation Test Adequacy Criterion: An Empirical Evaluation
State University of Maring\'a, Parana, Brasil, 2000. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{DelamaroMPM00,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Alberto Pasquini and Aditya P. Mathur},
title = {Interface Mutation Test Adequacy Criterion: An Empirical Evaluation},
institution = {State University of Maring\'a},
year = {2000},
type = {techreport},
number = {},
address = {Parana, Brasil},
month = {},
} |
| 667 | Paul E. Black and Vadim Okun and Yaacov Yesha
Mutation Operators for Specifications
The Fifteenth {IEEE} International Conference on Automated Software Engineering, {ASE} 2000, Grenoble, France, September 11-15, 2000, 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{BlackOY00,
author = {Paul E. Black and Vadim Okun and Yaacov Yesha},
title = {Mutation Operators for Specifications},
booktitle = {The Fifteenth {IEEE} International Conference on Automated Software Engineering, {ASE} 2000, Grenoble, France, September 11-15, 2000},
year = {2000},
address = {},
month = {},
pages = {81}
} |
| 668 | Wenliang Du and Aditya P. Mathur
Testing for Software Vulnerability Using Environment Perturbation
Proceeding of the International Conference on Dependable Systems and Networks (DSN'00)New York, NY, 25-28 June 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DuM00,
author = {Wenliang Du and Aditya P. Mathur},
title = {Testing for Software Vulnerability Using Environment Perturbation},
booktitle = {Proceeding of the International Conference on Dependable Systems and Networks (DSN'00)},
year = {2000},
address = {New York, NY},
month = {25-28 June},
pages = {603-612}
} |
| 669 | P. Vado and Y. Savaria and Y. Zoccarato and C. Robach
A Methodology for Validating Digital Circuits with Mutation Testing
Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'00)Geneva Switzerland, 28-31 May 2000. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{VadoSZR00,
author = {P. Vado and Y. Savaria and Y. Zoccarato and C. Robach},
title = {A Methodology for Validating Digital Circuits with Mutation Testing},
booktitle = {Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS'00)},
year = {2000},
address = {Geneva Switzerland},
month = {28-31 May},
pages = {343-346}
} |
| 670 | Paul Ammann
System Testing via Mutation Analysis of Model Checking Specifications
ACM SIGSOFT Software Engineering Notes, 25(1), January 2000. |
|
| | Abstract: The objective of this research is a novel combination of three important threads in software engineering: system level testing, formal methods, and mutation analysis. The research promises better methods, and mutation analysis. The research promises better methods to test software, and hence tools for developers to produce better software. |
| | @ARTICLE{Ammann00,
author = {Paul Ammann},
title = {System Testing via Mutation Analysis of Model Checking Specifications},
journal = {ACM SIGSOFT Software Engineering Notes},
year = {2000},
month = {January},
volume = {25},
number = {1},
pages = {33}
} |
