| 631 | Yu-Seung Ma and Yong-Rae Kwon and A. Jefferson Offutt
Inter-class Mutation Operators for Java
Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MaKO02,
author = {Yu-Seung Ma and Yong-Rae Kwon and A. Jefferson Offutt},
title = {Inter-class Mutation Operators for Java},
booktitle = {Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)},
year = {2002},
address = {Annapolis, Maryland},
month = {12-15 November},
pages = {352}
} |
| 632 | Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne
Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?
Software Testing, Verification and Reliability, 12(4), December 2002. |
|
| | Abstract: Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as statements, basic blocks or outcomes of decisions) as equal. In practice, however, the probability that a test case can expose a fault in a code element varies: some faults are more easily revealed than others. Thus, several researchers have suggested that if one could estimate the probability that a fault in a code element will cause a failure, one could use this estimate to determine the number of executions of a code element that are required to achieve a certain level of confidence in that element's correctness. This estimate, in turn, could be used to improve the fault-detection effectiveness of test suites and help testers distribute testing resources more effectively. This conjecture is intriguing; however, like many such conjectures it has never been directly examined empirically. If empirical evidence were to support this conjecture, it would motivate further research into methodologies for obtaining fault-exposure-potential estimates and incorporating them into test data adequacy criteria. This paper reports the results of experiments conducted to investigate the effects of incorporating an estimate of fault-exposure probability into the statement coverage test data adequacy criterion. The results of these experiments, however, ran contrary to the conjectures of previous researchers. Although incorporation of the estimates did produce statistically significant increases in the fault-detection effectiveness of test suites, these increases were quite small, suggesting that the approach might not be able to produce the gains hoped for and might not be worth the cost of its employment. |
| | @ARTICLE{ChenURER02,
author = {Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne},
title = {Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?},
journal = {Software Testing, Verification and Reliability},
year = {2002},
month = {December},
volume = {12},
number = {4},
pages = {197-218}
} |
| 633 | P. Chevalley
Applying Mutation Analysis for Object-oriented Programs Using a Reflective Approach
Proceedings of the 8th Asia-Pacific Software Engineering Conference (APSEC 01)Macau, China, 4-7 December 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Chevalley01,
author = {P. Chevalley},
title = {Applying Mutation Analysis for Object-oriented Programs Using a Reflective Approach},
booktitle = {Proceedings of the 8th Asia-Pacific Software Engineering Conference (APSEC 01)},
year = {2001},
address = {Macau, China},
month = {4-7 December},
pages = {267}
} |
| 634 | T. Y. Chen and T. H. Tse and Zhiquan Zhou
Fault-Based Testing in the Absence of an Oracle
Proceedings of the 25th International Computer Software and Applications Conference on Invigorating Software Development (COMPSAC'01)Chicago, Illinois, 08-12 October 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ChenTZ01,
author = {T. Y. Chen and T. H. Tse and Zhiquan Zhou},
title = {Fault-Based Testing in the Absence of an Oracle},
booktitle = {Proceedings of the 25th International Computer Software and Applications Conference on Invigorating Software Development (COMPSAC'01)},
year = {2001},
address = {Chicago, Illinois},
month = {08-12 October},
pages = {172}
} |
| 635 | Qiushuang Zhang, Ian G. Harris
A Validation Fault Model for Timing-Induced Functional Errors
Proceedings of the International Test Conference 2001 (ITC'01)Baltimore, Maryland, 30 October- 01 November 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ZhangH01,
author = {Qiushuang Zhang, Ian G. Harris},
title = {A Validation Fault Model for Timing-Induced Functional Errors},
booktitle = {Proceedings of the International Test Conference 2001 (ITC'01)},
year = {2001},
address = {Baltimore, Maryland},
month = {30 October- 01 November},
pages = {813}
} |
| 636 | Ivan Moore
Jester - a JUnit test tester
Proceeding of eXtreme Programming Conference (XP'01), 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Moore01,
author = {Ivan Moore},
title = {Jester - a JUnit test tester},
booktitle = {Proceeding of eXtreme Programming Conference (XP'01)},
year = {2001},
address = {},
month = {},
pages = {}
} |
| 637 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Interface Mutation: An Approach for Integration Testing
IEEE Transactions on Software Engineering, 27(3), May 2001. |
|
| | Abstract: The need for test adequacy criteria is widely recognized. Several criteria have been proposed for the assessment of adequacy of tests at the unit level. However, there remains a lack of criteria for the assessment of the adequacy of tests generated during integration testing. We present a mutation based interprocedural criterion, named Interface Mutation (IM), suitable for use during integration testing. A case study to evaluate the proposed criterion is reported. In the study, the UNIX sort utility was seeded with errors and Interface Mutation evaluated by measuring the cost of its application and its error revealing effectiveness. Alternative IM criteria using different sets of Interface Mutation operators were also evaluated. While comparing the error revealing effectiveness of these Interface Mutation-based test sets with same size randomly generated test sets, we observed that in most cases Interface Mutation based test sets are superior. The results suggest that Interface Mutation offers a viable test adequacy criteria for use at the integration level. |
| | @ARTICLE{DelamaroMM01,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Interface Mutation: An Approach for Integration Testing},
journal = {IEEE Transactions on Software Engineering},
year = {2001},
month = {May},
volume = {27},
number = {3},
pages = {228-247}
} |
| 638 | T. Olsson and P. Runeson
System Level Mutation Analysis Applied to a State-based Language
Proceedings of the 8th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ECBS'01)Washington DC, 17-20 April 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OlssonR01,
author = {T. Olsson and P. Runeson},
title = {System Level Mutation Analysis Applied to a State-based Language},
booktitle = {Proceedings of the 8th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ECBS'01)},
year = {2001},
address = {Washington DC},
month = {17-20 April},
pages = {222}
} |
| 639 | Suet Chun Lee and A. Jefferson Offutt
Generating Test Cases for XML-Based Web Component Interactions Using Mutation Analysis
Proceedings of the 12th International Symposium on Software Reliability Engineering (ISSRE'01)Hong Kong, China, November 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{LeeO01,
author = {Suet Chun Lee and A. Jefferson Offutt},
title = {Generating Test Cases for XML-Based Web Component Interactions Using Mutation Analysis},
booktitle = {Proceedings of the 12th International Symposium on Software Reliability Engineering (ISSRE'01)},
year = {2001},
address = {Hong Kong, China},
month = {November},
pages = {200-209}
} |
| 640 | A. Jefferson Offutt and Roland H. Untch
Mutation 2000: Uniting the Orthogonal
Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)San Jose, California, 6-7 October 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OffuttU01,
author = {A. Jefferson Offutt and Roland H. Untch},
title = {Mutation 2000: Uniting the Orthogonal},
booktitle = {Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)},
year = {2001},
address = {San Jose, California},
month = {6-7 October},
pages = {34-44}
} |
