Mutation Testing Publications

Search results for "all papers", found 857 papers, 86 pages

621Yu{-}Seung Ma and Yong Rae Kwon and Jeff Offutt
Inter-Class Mutation Operators for Java
13th International Symposium on Software Reliability Engineering {(ISSRE} 2002), 12-15 November 2002, Annapolis, MD, {USA}, 2002.
BibTeX | Abstract | PDF | DOI
622Branson W. Murrill and Larry Joe Morell and Erika Mir Olimpiew
A Perturbation-based Testing Strategy
Proceedings of the 8th International Conference on Engineering of Complex Computer Systems2-4 December, Greenbelt, Maryland 2002.
BibTeX | Abstract | URL
623Sudipto Ghosh
Towards Measurement of Testability of Concurrent Object-oriented Programs Using Fault Insertion: a Preliminary Investigation
Proceedings of the 2nd IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)Los Alamitos, California, 2002.
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624Roger T. Alexander and James M. Bieman and Sudipto Ghosh and Bixia Ji
Mutation of Java Objects
Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002.
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625Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Automatic Test Case Optimization Using a Bacteriological Adaptation Model: Application to .NET Components
Proceedings of the 17th IEEE International Conference on Automated Software Engineering (ASE'02)Edinburgh, Scotland, 23-27 September 2002.
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626P. Chevalley and Pascale Th\'evenod-Fosse
A Mutation Analysis Tool for Java Programs
International Journal on Software Tools for Technology Transfer, 5(1), November 2002.
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627P. Vilela and M. Machado and W. Eric Wong
Testing for Security Vulnerabilities in Software
Software Engineering and Applications, 2002.
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628Guido Wimmel and Jan Jurjens
Specification-Based Test Generation for Security-Critical Systems Using Mutations
Proceedings of the 4th International Conference on Formal Engineering Methods (ICFEM'02)Shanghai, China, 21-25 October 2002.
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629Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment
Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002.
BibTeX | Abstract | URL
630Roger T. Alexander and A. Jefferson Offutt and James M. Bieman
Syntactic Fault Patterns in OO Programs
Proceedings of the 8th International Conference on Engineering of Complex Computer Systems (ICECCS'02)Greenbelt, Maryland, 2-4 December 2002.
BibTeX | Abstract | URL