| 611 | Michael R. Lyu and Zubin Huang and Sam K. S. Sze and Xia Cai
An Empirical Study on Testing and Fault Tolerance for Software Reliability Engineering
Proceedings of the 14th International Symposium on Software Reliability Engineering (ISSRE'03)Denver,Colorado, 17-20 November 2003. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{LyuHC03,
author = {Michael R. Lyu and Zubin Huang and Sam K. S. Sze and Xia Cai},
title = {An Empirical Study on Testing and Fault Tolerance for Software Reliability Engineering},
booktitle = {Proceedings of the 14th International Symposium on Software Reliability Engineering (ISSRE'03)},
year = {2003},
address = {Denver,Colorado},
month = {17-20 November},
pages = {119- 130}
} |
| 612 | Jo{\~{a}}o Dur{\~{a}}es and Henrique Madeira
Definition of Software Fault Emulation Operators: {A} Field Data Study
2003 International Conference on Dependable Systems and Networks {(DSN} 2003), 22-25 June 2003, San Francisco, CA, USA, Proceedings, 2003. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{duraes_other_03,
author = {Jo{\~{a}}o Dur{\~{a}}es and Henrique Madeira},
title = {Definition of Software Fault Emulation Operators: {A} Field Data Study},
booktitle = {2003 International Conference on Dependable Systems and Networks {(DSN} 2003), 22-25 June 2003, San Francisco, CA, USA, Proceedings},
year = {2003},
address = {},
month = {},
pages = {105--114}
} |
| 613 | Yunzhan Gong and Wanli Xu and Xiaowei Li
An Expression's Single Fault Model and the Testing Methods
Proceedings of the 12th Asian Test Symposium (ATS'03)Xian, China, 16-19 November 2003. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{GongXL03,
author = {Yunzhan Gong and Wanli Xu and Xiaowei Li},
title = {An Expression's Single Fault Model and the Testing Methods},
booktitle = {Proceedings of the 12th Asian Test Symposium (ATS'03)},
year = {2003},
address = {Xian, China},
month = {16-19 November},
pages = {110}
} |
| 614 | James H. Andrews and Yingjun Zhang
General Test Result Checking with Log File Analysis
{IEEE} Trans. Software Eng., 29(7), 2003. |
|
| | Abstract: Available soon... |
| | @ARTICLE{andrews_TSE_03,
author = {James H. Andrews and Yingjun Zhang},
title = {General Test Result Checking with Log File Analysis},
journal = {{IEEE} Trans. Software Eng.},
year = {2003},
month = {},
volume = {29},
number = {7},
pages = {634--648}
} |
| 615 | T. Y. Chen and T. H. Tse and Zhiquan Zhou
Fault-based Testing Without the Need of Oracles
Information and Software Technology, 45(1), January 2003. |
|
| | Abstract: There are two fundamental limitations in software testing, known as the reliable test set problem and the oracle problem. Fault-based testing is an attempt by Morell to alleviate the reliable test set problem. In this paper, we propose to enhance fault-based testing to alleviate the oracle problem as well. We present an integrated method that combines metamorphic testing with fault-based testing using real and symbolic inputs. |
| | @ARTICLE{ChenTZ03,
author = {T. Y. Chen and T. H. Tse and Zhiquan Zhou},
title = {Fault-based Testing Without the Need of Oracles},
journal = {Information and Software Technology},
year = {2003},
month = {January},
volume = {45},
number = {1},
pages = {1-9}
} |
| 616 | Thitima Srivatanakul and John A. Clark and Susan Stepney and Fiona Polack
Challenging Formal Specifications by Mutation: a CSP Security Example
Proceedings of the 10th Asia-Pacific Software Engineering Conference (APSEC'03)Chiang Mai, Thailand, 10-12 December 2003. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{SrivatanakulCSP03,
author = {Thitima Srivatanakul and John A. Clark and Susan Stepney and Fiona Polack},
title = {Challenging Formal Specifications by Mutation: a CSP Security Example},
booktitle = {Proceedings of the 10th Asia-Pacific Software Engineering Conference (APSEC'03)},
year = {2003},
address = {Chiang Mai, Thailand},
month = {10-12 December},
pages = {340–350}
} |
| 617 | Ian G. Harris
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test, 20(4), July 2003. |
|
| | Abstract: The increasing use of hardware-software systems in cost-critical and life-critical applications has led to heightened
significance of design correctness of these systems. This article presents a summary of research in test generation and fault
models to support hardware-software covalidation. The covalidation problem involves the verification of design correctness
using simulation-based techniques. The article focuses on the test generation process for hardware-software systems and the
fault models which support test generation. |
| | @ARTICLE{Harris03,
author = {Ian G. Harris},
title = {Fault Models and Test Generation for Hardware-Software Covalidation},
journal = {IEEE Design & Test},
year = {2003},
month = {July},
volume = {20},
number = {4},
pages = {2003}
} |
| 618 | Willem Visser and Klaus Havelund and Guillaume P. Brat and Seungjoon Park and Flavio Lerda
Model Checking Programs
Autom. Softw. Eng., 10(2), 2003. |
|
| | Abstract: Available soon... |
| | @ARTICLE{visser_JPF,
author = {Willem Visser and Klaus Havelund and Guillaume P. Brat and Seungjoon Park and Flavio Lerda},
title = {Model Checking Programs},
journal = {Autom. Softw. Eng.},
year = {2003},
month = {},
volume = {10},
number = {2},
pages = {203--232}
} |
| 619 | Peter May and Keith Mander and Jon Timmis
Software Vaccination: An Artificial Immune System Approach to Mutation Testing
Proceedings of the 2nd International Conference Artificial Immune Systems (ICARIS'03), 1-3 September 2003. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MayMT03,
author = {Peter May and Keith Mander and Jon Timmis},
title = {Software Vaccination: An Artificial Immune System Approach to Mutation Testing},
booktitle = {Proceedings of the 2nd International Conference Artificial Immune Systems (ICARIS'03)},
year = {2003},
address = {},
month = {1-3 September},
pages = {81-92}
} |
| 620 | Robert M. Hierons
Comparing Test Sets and Criteria in the Presence of Test Hypotheses and Fault Domains
ACM Transactions on Software Engineering and Methodology, 11(4), October 2002. |
|
| | Abstract: A number of authors have considered the problem of comparing test sets and criteria. Ideally test sets are compared using a preorder with the property that test set T1 is at least as strong as T2 if whenever T2 determines that an implementation p is faulty, T1 will also determine that p is faulty. This notion can be extended to test criteria. However, it has been noted that very few test sets and criteria are comparable under such an ordering; instead orderings are based on weaker properties such as subsumes. This article explores an alternative approach, in which comparisons are made in the presence of a test hypothesis or fault domain. This approach allows strong statements about fault detecting ability to be made and yet for a number of test sets and criteria to be comparable. It may also drive incremental test generation. |
| | @ARTICLE{Hierons02,
author = {Robert M. Hierons},
title = {Comparing Test Sets and Criteria in the Presence of Test Hypotheses and Fault Domains},
journal = {ACM Transactions on Software Engineering and Methodology},
year = {2002},
month = {October},
volume = {11},
number = {4},
pages = {427-448}
} |
