Mutation Testing Publications

Search results for "all papers", found 857 papers, 86 pages

541Sagar Sen and Benoit Baudry
Mutation-based Model Synthesis in Model Driven Engineering
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
BibTeX | Abstract | URL
542Youssef Serrestou and Vincent Beroulle and Chantal Robach
How to Improve a Set of Design Validation Data by Using Mutation-Based Test
Proceedings of the IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS'06)Prague, Czech Republic, 18-21 April 2006.
BibTeX | Abstract | URL
543Jeremy S. Bradbury and James R. Cordy and Juergen Dingel
Mutation Operators for Concurrent Java (J2SE 5.0)
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
BibTeX | Abstract | URL
544Jeremy S. Bradbury and James R. Cordy and Juergen Dingel
ExMAn: A Generic and Customizable Framework for Experimental Mutation Analysis
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
BibTeX | Abstract | URL
545James H. Andrews and Lionel C. Briand and Yvan Labiche and Akbar Siami Namin
Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria
IEEE Transactions on Software Engineering, 32(8), August 2006.
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546Ahyoung Sung and Jina Jang and Byoungju Choi
Fault-Based Interface Testing Between Real-Time Operating System and Application
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
BibTeX | Abstract | URL
547James H. Andrews and Lionel C. Briand and Yvan Labiche and Akbar Siami Namin
Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria
{IEEE} Trans. Software Eng., 32(8), 2006.
BibTeX | Abstract | PDF | DOI
548Chang-ai Sun and Yunwei Dong and Richard Lai and K. Y. Sim and T. Y. Chen
Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions
Proceedings of the 6th IEEE International Conference on Computer and Information TechnologySeoul, Korea, 20-22 September 2006.
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549Fevzi Belli and Christof J. Budnik and W. Eric Wong
Basic Operations for Generating Behavioral Mutants
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, 2006.
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550Jon S. Baekken and Roger T. Alexander
A Candidate Fault Model for AspectJ Pointcuts
Proceedings of the 17th International Symposium on Software Reliability Engineering (ISSRE'06)Raleigh, North Carolina, 7-10 November 2006.
BibTeX | Abstract | URL