| 741 | Elaine Jessica Weyuker and T. Goradia and A. Singh
Automatically Generating Test Data from a Boolean Specification
IEEE Transactions on Software Engineering, 20(5), May 1994. |
|
| | Abstract: This paper presents a family of strategies for automatically generating test data for any implementation intended to satisfy a given specification that is a Boolean formula. The fault detection effectiveness of these strategies is investigated both analytically and empirically, and the costs, assessed in terms of test set size, are compared. |
| | @ARTICLE{WeyukerGS94,
author = {Elaine Jessica Weyuker and T. Goradia and A. Singh},
title = {Automatically Generating Test Data from a Boolean Specification},
journal = {IEEE Transactions on Software Engineering},
year = {1994},
month = {May},
volume = {20},
number = {5},
pages = {353-363}
} |
| 742 | Aditya P. Mathur and W. Eric Wong
A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria
Proceedings of the 22nd annual ACM Computer Science Conference on Scaling UpPhoenix, Arizona, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MathurW94a,
author = {Aditya P. Mathur and W. Eric Wong},
title = {A Theoretical Comparison Between Mutation and Data Flow Based Test Adequacy Criteria},
booktitle = {Proceedings of the 22nd annual ACM Computer Science Conference on Scaling Up},
year = {1994},
address = {Phoenix, Arizona},
month = {},
pages = {38-45}
} |
| 743 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan
Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLMJH94,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur and Md Joseph and R. Horgan},
title = {Effect of Test Set Size and Block Coverage on the Fault Detection Effectiveness},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {230-238}
} |
| 744 | S.C. Pinto Ferraz Fabbri and Marcio Eduardo Delamaro and Jose Carlos Maldonado and P.C. Masiero
Mutation Analysis Testing for Finite State Machines
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{FabbriDMM94,
author = {S.C. Pinto Ferraz Fabbri and Marcio Eduardo Delamaro and Jose Carlos Maldonado and P.C. Masiero},
title = {Mutation Analysis Testing for Finite State Machines},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {220-229}
} |
| 745 | A. Jefferson Offutt
A Practical System for Mutation Testing: Help for the Common Programmer
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years, 2-6 October 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Offutt94,
author = {A. Jefferson Offutt},
title = {A Practical System for Mutation Testing: Help for the Common Programmer},
booktitle = {Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years},
year = {1994},
address = {},
month = {2-6 October},
pages = {824-830}
} |
| 746 | Aditya P. Mathur
Mutation Testing
Encyclopedia of Software Engineering, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{EncyclopediaSE,
author = {Aditya P. Mathur},
title = {Mutation Testing},
booktitle = {Encyclopedia of Software Engineering},
year = {1994},
address = {},
month = {},
pages = {707–713}
} |
| 747 | A. Jefferson Offutt and W. M. Craft
Using Compiler Optimization Techniques to Detect Equivalent Mutants
Software Testing, Verification and Reliability, 4(3), September 1994. |
|
| | Abstract: Mutation analysis is a software testing technique that requires the tester to generate test data that will find specific, well-defined errors. Mutation testing executes many slightly differing versions, called mutants, of the same program to evaluate the quality of the data used to test the program. Although these mutants are generated and executed efficiently by automated methods, many of the mutants are functionally equivalent to the original program and are not useful for testing. Recognizing and eliminating equivalent mutants is currently done by hand, a time-consuming and arduous task. This problem is currently a major obstacle to the practical application of mutation testing.
This paper presents extensions to previous work in detecting equivalent mutants; specifically, algorithms for determining several classes of equivalent mutants are presented, an implementation of these algorithms is discussed, and results from using this implementation are presented. These algorithms are based on data flow analysis and six compiler optimization techniques. Each of these techniques is described together with how they are used to detect equivalent mutants. The design of the tool and some experimental results using it are also presented. |
| | @ARTICLE{OffuttC94,
author = {A. Jefferson Offutt and W. M. Craft},
title = {Using Compiler Optimization Techniques to Detect Equivalent Mutants},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {September},
volume = {4},
number = {3},
pages = {131-154}
} |
| 748 | A. Jefferson Offutt and Zhenyi Jin and Jie Pan
The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms
George Mason UniversityISSE-TR-94-110, Fairfax, Virginia, 1994. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{OffuttJP94,
author = {A. Jefferson Offutt and Zhenyi Jin and Jie Pan},
title = {The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms},
institution = {George Mason University},
year = {1994},
type = {techreport},
number = {ISSE-TR-94-110},
address = {Fairfax, Virginia},
month = {},
} |
| 749 | Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur
A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing
Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection, 25-26 April 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DeMilloTM94,
author = {Richard A. DeMillo and Li. TDsanchi and Aditya P. Mathur},
title = {A Two Dimensional Scheme To Evaluate The Adequacy Of Fault Tolerance Testing},
booktitle = {Proceedings of the 3rd Workshop on Integrating Error Models with Fault Injection},
year = {1994},
address = {},
month = {25-26 April},
pages = {54-56}
} |
| 750 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria
Software Testing, Verification and Reliability, 4(1), 1994. |
|
| | Abstract: Evaluation of the adequacy of a test set consisting of one or more test cases is a problem oftes encountered in software testing environments. Two test adequacy criiteria are considered, namely the data flow based all-uses criterion and a mutation based criterion. An empirical study was conducted to compare the difficulty of satisfying the two criteria and their costs. Similar studies conducted in the past are discussed in the light of this study. A discussion is also presented of how and why the results of this study, when viewed in conjunction with the results of earlier comparisons of testing methods, are useful to a software test team. |
| | @ARTICLE{MathurW94,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Data Flow and Mutation-based Test Adequacy Criteria},
journal = {Software Testing, Verification and Reliability},
year = {1994},
month = {},
volume = {4},
number = {1},
pages = {9 - 31}
} |
| 751 | A. Jefferson Offutt and S.D. Lee
An Empirical Evaluation of Weak Mutation
IEEE Transactions on Software Engineering, 20(5), May 1994. |
|
| | Abstract: Mutation testing is a fault-based technique for unit-level software testing. Weak mutation was proposed as a way to reduce the expense of mutation testing. Unfortunately, weak mutation is also expected to provide a weaker test of the software than mutation testing does. This paper presents results from an implementation of weak mutation, which we used to evaluate the effectiveness versus the efficiency of weak mutation. Additionally, we examined several options in an attempt to find the most appropriate way to implement weak mutation. Our results indicate that weak mutation can be applied in a manner that is almost as effective as mutation testing, and with significant computational savings. |
| | @ARTICLE{OffuttL94,
author = {A. Jefferson Offutt and S.D. Lee},
title = {An Empirical Evaluation of Weak Mutation},
journal = {IEEE Transactions on Software Engineering},
year = {1994},
month = {May},
volume = {20},
number = {5},
pages = {337-344}
} |
| 752 | W. Eric Wong
On Mutation and Data Flow
Purdue University, West Lafayette, Indiana, 1993.Unknown- |
|
| | Abstract: Available soon... |
| | @PHDTHESIS{Wong93,
author = {W. Eric Wong},
title = {On Mutation and Data Flow},
school = {Purdue University},
year = {1993},
type = {phdthesis},
address = {West Lafayette, Indiana},
month = {},
} |
| 753 | Aditya P. Mathur and W. Eric Wong
An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{MathurW93,
author = {Aditya P. Mathur and W. Eric Wong},
title = {An Empirical Comparison of Mutation and Data Flow Based Test Adequacy Criteria},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
| 754 | Phyllis G. Frankl and Stewart N. Weiss
An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing
{IEEE} Trans. Software Eng., 19(8), 1993. |
|
| | Abstract: Available soon... |
| | @ARTICLE{FranklW93a,
author = {Phyllis G. Frankl and Stewart N. Weiss},
title = {An Experimental Comparison of the Effectiveness of Branch Testing and Data Flow Testing},
journal = {{IEEE} Trans. Software Eng.},
year = {1993},
month = {},
volume = {19},
number = {8},
pages = {774--787}
} |
| 755 | Stewart N. Weiss and Vladimir N. Fleyshgakker
Improved Serial Algorithms for Mutation Analysis
ACM SIGSOFT Software Engineering Notes, 18(3), July 1993. |
|
| | Abstract: Available soon... |
| | @ARTICLE{WeissF93,
author = {Stewart N. Weiss and Vladimir N. Fleyshgakker},
title = {Improved Serial Algorithms for Mutation Analysis},
journal = {ACM SIGSOFT Software Engineering Notes},
year = {1993},
month = {July},
volume = {18},
number = {3},
pages = {149-158}
} |
| 756 | Richard A. DeMillo and A. Jefferson Offutt
Experimental Results From an Automatic Test Case Generator
ACM Transactions on Software Engineering and Methodology, 2(2), April 1993. |
|
| | Abstract: Constraint-based testing is a novel way of generating test data to detect specific types of common programming faults. The conditions under which faults will be detected are encoded as mathematical systems of constraints in terms of program symbols. A set of tools, collectively called Godzilla, has been implemented that automatically generates constraint systems and solves them to create test cases for use by the Mothra testing system. Experimental results from using Godzilla show that the technique can produce test data that is very close in terms of mutation adequacy to test data that is produced manually, and at substantially reduced cost. Additionally, these experiments have suggested a new procedure for unit testing, where test cases are viewed as throw-away items rather than scarce resources. |
| | @ARTICLE{DeMilloO93,
author = {Richard A. DeMillo and A. Jefferson Offutt},
title = {Experimental Results From an Automatic Test Case Generator},
journal = {ACM Transactions on Software Engineering and Methodology},
year = {1993},
month = {April},
volume = {2},
number = {2},
pages = {109-127}
} |
| 757 | Martin R. Woodward
Mutation Testng - Its Origin and Evolution
Journal of Information and Software Technology, 35(3), March 1993. |
|
| | Abstract: Available soon... |
| | @ARTICLE{Woodward93b,
author = {Martin R. Woodward},
title = {Mutation Testng - Its Origin and Evolution},
journal = {Journal of Information and Software Technology},
year = {1993},
month = {March},
volume = {35},
number = {3},
pages = {163–169}
} |
| 758 | C. N. Zapf
A Distributed Interpreter for the Mothra Mutation Testing System
Clemson University, Clemson, South Carolina, 1993.Unknown- |
|
| | Abstract: Available soon... |
| | @PHDTHESIS{Zapf93,
author = {C. N. Zapf},
title = {A Distributed Interpreter for the Mothra Mutation Testing System},
school = {Clemson University},
year = {1993},
type = {phdthesis},
address = {Clemson, South Carolina},
month = {},
} |
| 759 | Martin R. Woodward
Errors in Algebraic Specifications and an Experimental Mutation Testing Tool
Software Engineering Journal, 8(4), July 1993. |
|
| | Abstract: There is an increasing trend towards more formality in the development of specifications of software systems in order to reduce the likelihood of errors as early as possible in the development process. The algebraic approach to specification, with its equational form, leads to the added advantage of executability via the process of term rewriting. Nevertheless, erroneous algebraic specifications can still be developed. As evidence of possible errors, the algebraic specifications produced by students have been analysed and the results are presented. The paper describes OBJTEST, a prototype testing system for algebraic specifications. The two principal facets of the system are the user-guided automatic generation of sets of test expressions from a specification, and then the use of these test expressions in mutation testing of the given specification. Some preliminary experience with the system is reported |
| | @ARTICLE{Woodward93,
author = {Martin R. Woodward},
title = {Errors in Algebraic Specifications and an Experimental Mutation Testing Tool},
journal = {Software Engineering Journal},
year = {1993},
month = {July},
volume = {8},
number = {4},
pages = {221-224}
} |
| 760 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Purdue University, West Lafayette, Indiana, 1993. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{WongM93,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
institution = {Purdue University},
year = {1993},
type = {techreport},
number = {},
address = {West Lafayette, Indiana},
month = {},
} |
