| 721 | Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong
Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods
IEEE Transactions of Software Engineering, 21(10), October 1995. |
|
| | Abstract: Available soon... |
| | @ARTICLE{DeMilloMW95,
author = {Richard A. DeMillo and Aditya P. Mathur and W. Eric Wong},
title = {Some Critical Remarks on a Hierarchy of Fault-Detecting Abilities of Test Methods},
journal = {IEEE Transactions of Software Engineering},
year = {1995},
month = {October},
volume = {21},
number = {10},
pages = {858-862}
} |
| 722 | W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur
Effect of Test Set Minimization on Fault Detection Effectiveness
Proceedings of the 17th International Conference on Software Engineering (ICSE '95)Seattle, Washington, 23-30 April 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHLM95,
author = {W. Eric Wong and Joseph R. Horgan and Saul London and Aditya P. Mathur},
title = {Effect of Test Set Minimization on Fault Detection Effectiveness},
booktitle = {Proceedings of the 17th International Conference on Software Engineering (ICSE '95)},
year = {1995},
address = {Seattle, Washington},
month = {23-30 April},
pages = {41-50}
} |
| 723 | A. Jeff Offutt and J. Pan and Jeffrey M. Voas
Procedures for Reducing the Size of Coverage-based Test Sets
Proceedings of the 12 International Conference on Testing Computer SoftwareWashington, DC, June 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OffuttPV95,
author = {A. Jeff Offutt and J. Pan and Jeffrey M. Voas},
title = {Procedures for Reducing the Size of Coverage-based Test Sets},
booktitle = {Proceedings of the 12 International Conference on Testing Computer Software},
year = {1995},
address = {Washington, DC},
month = {June},
pages = {111-123}
} |
| 724 | Sandra Camargo Pinto Ferraz Fabbri and Jose Carlos Maldonado and Paulo Cesar Masiero and Marcio Eduardo Delamaro and W. Eric Wong
Mutation Testing Applied to Validate Specifications Based on Petri Nets
Proceedings of the IFIP TC6 8th International Conference on Formal Description Techniques VIII, 1995. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{FabbriMMDW95,
author = {Sandra Camargo Pinto Ferraz Fabbri and Jose Carlos Maldonado and Paulo Cesar Masiero and Marcio Eduardo Delamaro and W. Eric Wong},
title = {Mutation Testing Applied to Validate Specifications Based on Petri Nets},
booktitle = {Proceedings of the IFIP TC6 8th International Conference on Formal Description Techniques VIII},
year = {1995},
address = {},
month = {},
pages = {329-337}
} |
| 725 | W. Eric Wong and Aditya P. Mathur
Reducing the Cost of Mutation Testing: An Empirical Study
Journal of Systems and Software, 31(3), December 1995. |
|
| | Abstract: Amongst the various testing strategies, mutation testing has been empirically found to be the most effective in detecting faults. However, mutation often imposes unacceptable demands on computing and human resources due to the large number of mutants that need to be compiled and executed on one or more test cases. In addition, the tester needs to examine many mutants and analyze these for possible equivalence with the program under test. For these reasons, mutation is generally regarded by the practicing test engineer as too expensive to use. As one significant component of the cost of mutation is the execution of mutants against test cases, we believe that the cost can be reduced dramatically by reducing the number of mutants that need to be examined. We report the results from a case study designed to investigate two alternatives to reduce the cost of mutation. The alternatives considered are: (1) the randomly selected x'% mutation, and (2) the constrained mutation. We provide experimental data indicating that both alternatives lead to test sets that distinguish a significant number of all mutants and provide high all-uses coverage. |
| | @ARTICLE{WongM95,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Reducing the Cost of Mutation Testing: An Empirical Study},
journal = {Journal of Systems and Software},
year = {1995},
month = {December},
volume = {31},
number = {3},
pages = {185-196}
} |
| 726 | K. S. How Tai Wah
Fault Coupling in Finite Bijective Functions
Software Testing, Verification and Reliability, 5(1), 1995. |
|
| | Abstract: Fault-based testing attempts to show that particular faults cannot exist in software by using test sets that differentiate between the original program (hypothesized to be correct) and faulty alternate programs. The success of this approach depends on a number of assumptions, notably that programmers are competent insofar as they only commit relatively trivial faults, and that faults only couple infrequently. Fault coupling occurs when test sets are able to differentiate between the original program and faulty alternate programs when faults occur in isolation, but not when they occur in combination; it is a complicating factor in fault-based testing. Fault coupling is studied here within the context of finite bijective functions. A complete mathematical solution of the problem is possible in this simplified case; the results indicate that fault coupling does indeed occur infrequently, and are thus in agreement with the empirical results obtained by others in the field. One surprising result is that certain kinds of test set are able to avoid fault coupling altogether. |
| | @ARTICLE{Wah95,
author = {K. S. How Tai Wah},
title = {Fault Coupling in Finite Bijective Functions},
journal = {Software Testing, Verification and Reliability},
year = {1995},
month = {},
volume = {5},
number = {1},
pages = {3-47}
} |
| 727 | R. A. DeMillo and A. P. Mathur
A Grammar Based Fault Classification Scheme and its Application to the Classification of the Errors of TeX
Purdue UniversitySERC-TR-165-P, West Lafayette, Indiana, 1995. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{DeMilloM95,
author = {R. A. DeMillo and A. P. Mathur},
title = {A Grammar Based Fault Classification Scheme and its Application to the Classification of the Errors of TeX},
institution = {Purdue University},
year = {1995},
type = {techreport},
number = {SERC-TR-165-P},
address = {West Lafayette, Indiana},
month = {},
} |
| 728 | Roland H. Untch
Schema-based Mutation Analysis: A New Test Data Adequacy Assessment Method
Clemson University, Clemson, South Carolina, 1995.Unknown- |
|
| | Abstract: Mutation-based software testing, or \em mutation testing, is a
powerful testing technique applied primarily at the unit software level.
Central to mutation testing is the need to analyze a test set to
determine a quality measure called the \em mutation adequacy score\,;
this assessment process is called \em mutation analysis. Unfortunately,
the conventional method of performing mutation analysis, which requires
interpreting many slightly different versions of the same program, has
significant problems. Automated mutation analysis systems based on the
conventional interpretive method are slow, laborious to build, and usually
unable to completely emulate the intended operational environment of the
software being tested.
This research presents a solution to these problems:
the \underlineMutant \underlineSchema \underlineGeneration (MSG) method.
Rather than mutating an intermediate form of the program that then must be
interpreted, this new method describes how to
encode all mutations into one source-level program, a ``metamutant''\@.
This program is then compiled (once) with the same compiler used during
development and is executed in the same operational environment at
compiled-program speeds. Since mutation systems based on mutant schemata
do not need to provide run-time semantics and environment, they are
significantly less complex and easier to build than interpretive systems,
as well as more portable.
An approach to automatically generating metamutants
using attribute grammars is also presented.
An MSG-based prototype mutation analysis system, \tt TUMS, was
designed and implemented to demonstrate the automated generation of
metamutants and to allow empirical performance studies to be conducted.
Benchmarks show \tt TUMS significantly faster than \tt Mothra,
a conventional interpretive mutation analysis system, with speed-ups
as high as an order-of-magnitude observed.
Additional studies are reported that contrast the performance of
\tt TUMS to a hypothetical ``ideal'' mutation analysis system.
We conclude that high performance mutation analysis is possible
through the \mboxcreation and instantiation of mutant schemata and that
the MSG method described in this dissertation is a viable and desirable
approach for building automated mutation analysis systems. |
| | @PHDTHESIS{Untch95,
author = {Roland H. Untch},
title = {Schema-based Mutation Analysis: A New Test Data Adequacy Assessment Method},
school = {Clemson University},
year = {1995},
type = {phdthesis},
address = {Clemson, South Carolina},
month = {December},
} |
| 729 | W. Eric Wong and Aditya P. Mathur
Fault Detection Effectiveness of Mutation and Data Flow Testing
Software Quality Journal, 4(1), March 1995. |
|
| | Abstract: We report results from an experiment to compare the fault detection effectiveness of mutation, its variants and the all-uses data flow criteria. Adequate test sets were generated randomly, as opposed to by human testers as in some previous studies. We view our results in the light of those from earlier studies comparing mutation with path-oriented testing strategies. We identify and discuss factors that one might consider while evaluating an adequacy criterion for use in practice. Results from our experiments strengthen a hypothesis that an adequacy criterion based on one of the two variants of mutation has superior fault detection effectiveness than that of the all-uses criterion. |
| | @ARTICLE{WongM95a,
author = {W. Eric Wong and Aditya P. Mathur},
title = {Fault Detection Effectiveness of Mutation and Data Flow Testing},
journal = {Software Quality Journal},
year = {1995},
month = {March},
volume = {4},
number = {1},
pages = {69-83}
} |
| 730 | Pascale Th\'evenod-Fosse and C. Mazuet and Yves Crouzet
On Statistical Testing of Synchronous Data Flow Programs
Proceedings of the First European Dependable Computing Conference (EDDC'94)Berlin, Allemagne, 4-6 Octobre 1994. |
|
| | Abstract: The paper addresses the issue of testing programs written in the synchronous data flow language LUSTRE. We define a mixed strategy which combines statistical testing and deterministic extremal values testing. Statistical testing involves exercising a program with random inputs, the input distribution and the number of test data being determined according to test criteria. Three criteria based on the finite state automaton produced by the LUSTRE compiler are studied, the feasibility of the method for designing test sets according to them being exemplified on a real-case study. Then, mutation analysis (here, specific to LUSTRE) is used to assess the efficiency of the test sets. The results allow us (i) to define the most cost-effective criterion for designing efficient statistical test sets of reasonable size, and (ii) to show the high fault revealing power of the corresponding mixed strategy, killing the whole set of 310 mutants involved in the experiments. |
| | @INPROCEEDINGS{ThevenodMC94,
author = {Pascale Th\'evenod-Fosse and C. Mazuet and Yves Crouzet},
title = {On Statistical Testing of Synchronous Data Flow Programs},
booktitle = {Proceedings of the First European Dependable Computing Conference (EDDC'94)},
year = {1994},
address = {Berlin, Allemagne},
month = {4-6 Octobre},
pages = {250–267}
} |
| 731 | A. Jefferson Offutt and Stephen D. Lee
An Empirical Evaluation of Weak Mutation
{IEEE} Trans. Software Eng., 20(5), 1994. |
|
| | Abstract: Available soon... |
| | @ARTICLE{OffuttL94,
author = {A. Jefferson Offutt and Stephen D. Lee},
title = {An Empirical Evaluation of Weak Mutation},
journal = {{IEEE} Trans. Software Eng.},
year = {1994},
month = {},
volume = {20},
number = {5},
pages = {337--344}
} |
| 732 | W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur
Constrained Mutation in C Programs
Proceedings of the 8th Brazilian Symposium on Software EngneeringCuritiba, Brazil, October 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongDMM94,
author = {W. Eric Wong and Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Constrained Mutation in C Programs},
booktitle = {Proceedings of the 8th Brazilian Symposium on Software Engneering},
year = {1994},
address = {Curitiba, Brazil},
month = {October},
pages = {439-452}
} |
| 733 | Phyllis G. Frankl and Stewart N. Weiss and Cang Hu
All-Uses Versus Mutation Testing: An Experimental Comparison of Effectiveness
Polytechnic University, Brooklyn, New York, 1994. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{FranklWH94,
author = {Phyllis G. Frankl and Stewart N. Weiss and Cang Hu},
title = {All-Uses Versus Mutation Testing: An Experimental Comparison of Effectiveness},
institution = {Polytechnic University},
year = {1994},
type = {techreport},
number = {},
address = {Brooklyn, New York},
month = {},
} |
| 734 | Hong Zhu and Patrick A. V. Hall and John H. R. May and T. Cockram
Injecting Faults into Environment Simulators for Testing Safety Critical Software
Proceedings of the 1st European Dependable Computing Conference on Dependable Computing (EDCC'94), 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ZhuHMC94,
author = {Hong Zhu and Patrick A. V. Hall and John H. R. May and T. Cockram},
title = {Injecting Faults into Environment Simulators for Testing Safety Critical Software},
booktitle = {Proceedings of the 1st European Dependable Computing Conference on Dependable Computing (EDCC'94)},
year = {1994},
address = {},
month = {},
pages = {235-249}
} |
| 735 | E. Jenn and J. Arlat and M. Rimem and J. Ohlsson and J. Karlsson
Fault Injection Into VHDL Models: the MEFISTO Tool
Proceedings of the 24th International Symposium on Fault-Tolerant Computing (FTCS'24), 15-17 June 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{JennAROK94,
author = {E. Jenn and J. Arlat and M. Rimem and J. Ohlsson and J. Karlsson},
title = {Fault Injection Into VHDL Models: the MEFISTO Tool},
booktitle = {Proceedings of the 24th International Symposium on Fault-Tolerant Computing (FTCS'24)},
year = {1994},
address = {},
month = {15-17 June},
pages = {66 - 75}
} |
| 736 | K. Tewary and Mary Jean Harrold
Fault Modeling Using the Program Dependence Graph
Proceedings of the 5th International Symposium on Software Reliability EngineeringMonterey, California, 6-9 November 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{TewaryH94,
author = {K. Tewary and Mary Jean Harrold},
title = {Fault Modeling Using the Program Dependence Graph},
booktitle = {Proceedings of the 5th International Symposium on Software Reliability Engineering},
year = {1994},
address = {Monterey, California},
month = {6-9 November},
pages = {126-135}
} |
| 737 | Sandra Camargo Pinto Ferraz Fabbri and M{\'{a}}rcio Eduardo Delamaro and Jos{\'{e}} Carlos Maldonado and Paulo C{\'{e}}sar Masiero
Mutation analysis testing for finite state machines
5th International Symposium on Software Reliability Engineering, {ISSRE} 1994, Monterey, CA, USA, November 6-9, 1994, 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{fabbri_ISSRE_94,
author = {Sandra Camargo Pinto Ferraz Fabbri and M{\'{a}}rcio Eduardo Delamaro and Jos{\'{e}} Carlos Maldonado and Paulo C{\'{e}}sar Masiero},
title = {Mutation analysis testing for finite state machines},
booktitle = {5th International Symposium on Software Reliability Engineering, {ISSRE} 1994, Monterey, CA, USA, November 6-9, 1994},
year = {1994},
address = {},
month = {},
pages = {220--229}
} |
| 738 | Vladimir N. Fleyshgakker and Stewart N. Weiss
Efficient Mutation Analysis: A New Approach
Proceedings of the International Symposium on Software Testing and Analysis (ISSTA'94)Seattle, Washington, August 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{FleyshgakkerW94,
author = {Vladimir N. Fleyshgakker and Stewart N. Weiss},
title = {Efficient Mutation Analysis: A New Approach},
booktitle = {Proceedings of the International Symposium on Software Testing and Analysis (ISSTA'94)},
year = {1994},
address = {Seattle, Washington},
month = {August},
pages = {185-195}
} |
| 739 | Jie Pan
Using Constraints to Detect Equivalent Mutants
George Mason University, Fairfax VA, 1994. |
|
| | Abstract: Available soon... |
| | @MASTERSTHESIS{Pan94,
author = {Jie Pan},
title = {Using Constraints to Detect Equivalent Mutants},
school = {George Mason University},
year = {1994},
type = {mastersthesis},
address = {Fairfax VA},
month = {},
} |
| 740 | Jane Huffman Hayes
Testing of Object-oriented Programming Systems (OOPS): A fault-based Approach
Proceedings of the International Symposium on Object-Oriented Methodologies and Systems (ISOOMS'94)Palermo, Italy, 21–22 September 1994. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Hayes94,
author = {Jane Huffman Hayes},
title = {Testing of Object-oriented Programming Systems (OOPS): A fault-based Approach},
booktitle = {Proceedings of the International Symposium on Object-Oriented Methodologies and Systems (ISOOMS'94)},
year = {1994},
address = {Palermo, Italy},
month = {21–22 September},
pages = {205-220}
} |
