| 701 | Mary Jean Harrold and A. Jefferson Offutt and Kanupriya Tewary An Approach to Fault Modeling and Fault Seeding Using the Program Dependence Graph Journal of Systems and Software, 36(3), March 1997. |
|
| | Abstract: We present a fault-classification scheme and a fault-seeding method that are based on the manifestation of faults in the program dependence graph (PDG). We enhance the domain/computation fault classification scheme developed by Howden to further characterize faults as structural and statement-level depending on the differences between the PDG for the original program and the PDG for the faulty program. We perform transformations on the PDG to produce the different types of faults described in our PDG-based fault-classification scheme. To demonstrate the usefulness of our technique, we implemented a fault seeder to embed faults in C programs. Our fault seeder makes controlled fault transformations to the PDG for a C program, and generates C code from the transformed PDG. The current version of the fault seeder creates multiple fault-seeded versions of the original program, each with one known fault. To demonstrate the operation of the fault seeder, we used it to perform a study of the effectiveness of dataflow testing and mutation testing using a set of faulty programs generated by our fault seeder. We also used the faulty programs to determine the mutation adequacy and detaflow adequacy of the fault-detecting test sets. |
| | @ARTICLE{HarroldOT97,
author = {Mary Jean Harrold and A. Jefferson Offutt and Kanupriya Tewary},
title = {An Approach to Fault Modeling and Fault Seeding Using the Program Dependence Graph},
journal = {Journal of Systems and Software},
year = {1997},
month = {March},
volume = {36},
number = {3},
pages = {273-295}
} |
| 702 | L. Morell and B. Murrill and R. Rand Perturbation Analysis of Computer Programs Proceedings of the 12th Annual Conference on Computer Assurance (COMPASS'97)Gaithersburg, Maryland, 16-19 June 1997. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MorellMR97,
author = {L. Morell and B. Murrill and R. Rand},
title = {Perturbation Analysis of Computer Programs},
booktitle = {Proceedings of the 12th Annual Conference on Computer Assurance (COMPASS'97)},
year = {1997},
address = {Gaithersburg, Maryland},
month = {16-19 June},
pages = {77-87}
} |
| 703 | Phyllis G. Frankl and Stewart N. Weiss and Cang Hu All-uses vs Mutation Testing: an Experimental Comparison of Effectiveness Journal of Systems and Software, 38(3), September 1997. |
|
| | Abstract: The effectiveness of a test data adequacy criterion for a given program and specification is the probability that a test set satisfying the criterion will expose a fault. Experiments were performed to compare the effectiveness of the mutation testing and all-uses test data adequacy criteria at various coverage levels, for randomly generated test sets. Large numbers of test sets were generated and executed, and for each, the proportion of mutants killed or def-use associations covered was measured. This data was used to estimate and compare the effectiveness of the criteria. The results were mixed: at the highest coverage levels considered, mutation was more effective than all-uses for five of the nine subjects, all-uses was more effective than mutation for two subjects, and there was no clear winner for two subjects. However, mutation testing was much more expensive than all-uses. The relationship between coverage and effectiveness for fixed-sized test sets was also explored and was found to be nonlinear and, in many cases, nonmonotonic. |
| | @ARTICLE{FranklWH97,
author = {Phyllis G. Frankl and Stewart N. Weiss and Cang Hu},
title = {All-uses vs Mutation Testing: an Experimental Comparison of Effectiveness},
journal = {Journal of Systems and Software},
year = {1997},
month = {September},
volume = {38},
number = {3},
pages = {235-253}
} |
| 704 | C. Aktouf and G. Al-Hayek and C. Robach Concurrent Testing of VLSI Digital Signal Processors Using Mutation Based Testing Proceedings of the Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97)Paris, France, 20-22 October 1997. |
|
| | Abstract: This paper presents a new approach which allows VLSI digital signal processors (DSP) to be totally tested concurrently within useful computation. This approach uses a software technique called Mutation resting which has been successfully applied to hardware devices. Based on realistic examples of signal processing applications and state-of-the-art DSPs, the approach is shown highly efficient in terms of fault coverage and fault latency. |
| | @INPROCEEDINGS{AktoufAR97,
author = {C. Aktouf and G. Al-Hayek and C. Robach},
title = {Concurrent Testing of VLSI Digital Signal Processors Using Mutation Based Testing},
booktitle = {Proceedings of the Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97)},
year = {1997},
address = {Paris, France},
month = {20-22 October},
pages = {94-99}
} |
| 705 | Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application Proceedings of the 21st Annual International Computer Software and Applications Conference (COMPSAC'07)Washington, DC, 11-15 August 1997. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WongHMP97,
author = {Eric Wong and Joseph R. Horgan and Aditya P. Mathur and Alberto Pasquini},
title = {Test Set Size Minimization and Fault Detection Effectiveness: A Case Study in a Space Application},
booktitle = {Proceedings of the 21st Annual International Computer Software and Applications Conference (COMPSAC'07)},
year = {1997},
address = {Washington, DC},
month = {11-15 August},
pages = {522-528}
} |
| 706 | Mei-Chen Hsueh and Timothy K. Tsai and Ravishankar K. Iyer Fault Injection Techniques and Tools IEEE Computer, 30(4), April 1997. |
|
| | Abstract: Fault injection is important to evaluating the dependability of computer systems. Researchers and engineers have created many novel methods to inject faults, which can be implemented in both hardware and software. The contrast between the hardware and software methods lies mainly in the fault injection points they can access, the cost and the level of perturbation. Hardware methods can inject faults into chip pins and internal components, such as combinational circuits and registers that are not software-addressable. On the other hand, software methods are convenient for directly producing changes at the software-state level. Thus, we use hardware methods to evaluate low-level error detection and masking mechanisms, and software methods to test higher level mechanisms. Software methods are less expensive, but they also incur a higher perturbation overhead because they execute software on the target system. |
| | @ARTICLE{HsuehTI97,
author = {Mei-Chen Hsueh and Timothy K. Tsai and Ravishankar K. Iyer},
title = {Fault Injection Techniques and Tools},
journal = {IEEE Computer},
year = {1997},
month = {April},
volume = {30},
number = {4},
pages = {75-82}
} |
| 707 | Jeffrey Voas and Gary McGraw Software Fault Injection: Inoculating Programs Against Errors Unknown- |
|
| | Abstract: Not available |
| | Unknown++ |
| 708 | Kuo{-}Chung Tai Theory of Fault-Based Predicate Testing for Computer Programs {IEEE} Trans. Software Eng., 22(8), 1996. |
|
| | Abstract: Available soon... |
| | @ARTICLE{Tai96,
author = {Kuo{-}Chung Tai},
title = {Theory of Fault-Based Predicate Testing for Computer Programs},
journal = {{IEEE} Trans. Software Eng.},
year = {1996},
month = {},
volume = {22},
number = {8},
pages = {552--562}
} |
| 709 | A. Jefferson Offutt and Jeff Voas and Jeff Payn Mutation Operators for Ada George Mason UniversityISSE-TR-96-09, Fairfax, Virginia, 1996. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{OffuttVP96,
author = {A. Jefferson Offutt and Jeff Voas and Jeff Payn},
title = {Mutation Operators for Ada},
institution = {George Mason University},
year = {1996},
type = {techreport},
number = {ISSE-TR-96-09},
address = {Fairfax, Virginia},
month = {},
} |
| 710 | A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang An Experimental Evaluation of Data Flow and Mutation Testing Software:Practice and Experience, 26(2), February 1996. |
|
| | Abstract: Two experimental comparisons of data flow and mutation testing are presented. These techniques are widely considered to be effective for unit-level software testing, but can only be analytically compared to a limited extent. We compare the techniques by evaluating the effectiveness of test data developed for each. We develop ten independent sets of test data for a number of programs: five to satisfy the mutation criterion and five to satisfy the all-uses data-flow criterion. These test sets are developed using automated tools, in a manner consistent with the way a test engineer might be expected to generate test data in practice. We use these test sets in two separate experiments. First we measure the effectiveness of the test data that was developed for one technique in terms of the other. Second, we investigate the ability of the test sets to find faults. We place a number of faults into each of our subject programs, and measure the number of faults that are detected by the test sets. Our results indicate that while both techniques are effective, mutation-adequate test sets are closer to satisfying the data flow criterion, and detect more faults. |
| | @ARTICLE{OffuttPTZ96,
author = {A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang},
title = {An Experimental Evaluation of Data Flow and Mutation Testing},
journal = {Software:Practice and Experience},
year = {1996},
month = {February},
volume = {26},
number = {2},
pages = {165-176}
} |
| 711 | A. Jefferson Offutt and Jie Pan Detecting Equivalent Mutants and the Feasible Path Problem Proceedings of the 1996 Annual Conference on Computer AssuranceGaithersburg, Maryland, June 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OffuttP96,
author = {A. Jefferson Offutt and Jie Pan},
title = {Detecting Equivalent Mutants and the Feasible Path Problem},
booktitle = {Proceedings of the 1996 Annual Conference on Computer Assurance},
year = {1996},
address = {Gaithersburg, Maryland},
month = {June},
pages = {224-236}
} |
| 712 | A. Jefferson Offutt and Ammei Lee and Gregg Rothermel and Roland H. Untch and Christian Zapf An Experimental Determination of Sufficient Mutant Operators ACM Transactions on Software Engineering and Methodology, 5(2), April 1996. |
|
| | Abstract: Mutation testing is a technique for unit testing software that, although powerful, is computationally expensive. The principal expense of mutation is that many variants of the test program, called mutants, must be repeatedly executed. This paper quanti es the expense of mutation in terms of the number of mutants that are created, then proposes and evaluates a technique that reduces the number of mutants by an order of magnitude. Selective mutation reduces the cost of mutation testing by reducing the number of mutants. This paper reports experimental results that compare selective mutation testing with standard, or non-selective, mutation testing, and results that quantify the savings achieved by selective mutation testing. The results support the hypothesis that selective mutation is almost as strong as non-selective mutation; in experimental trials selective mutation provides almost the same coverage as non-selective mutation, with a four-fold or more reduction in the number of mutants. |
| | @ARTICLE{OffuttLRUZ96,
author = {A. Jefferson Offutt and Ammei Lee and Gregg Rothermel and Roland H. Untch and Christian Zapf},
title = {An Experimental Determination of Sufficient Mutant Operators},
journal = {ACM Transactions on Software Engineering and Methodology},
year = {1996},
month = {April},
volume = {5},
number = {2},
pages = {99-118}
} |
| 713 | A. Jefferson Offutt and Ammei Lee and Gregg Rothermel and Roland H. Untch and Christian Zapf An Experimental Determination of Sufficient Mutant Operators {ACM} Trans. Softw. Eng. Methodol., 5(2), 1996. |
|
| | Abstract: Available soon... |
| | @ARTICLE{OffuttLRUZ96,
author = {A. Jefferson Offutt and Ammei Lee and Gregg Rothermel and Roland H. Untch and Christian Zapf},
title = {An Experimental Determination of Sufficient Mutant Operators},
journal = {{ACM} Trans. Softw. Eng. Methodol.},
year = {1996},
month = {},
volume = {5},
number = {2},
pages = {99--118}
} |
| 714 | A. Jefferson Offutt and J. Huffman Hayes A Semantic Model of Program Faults Proceedings of the International Symposium on Software Testing and Analysis (ISSTA'96)San Diego, California, January 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OffuttH96,
author = {A. Jefferson Offutt and J. Huffman Hayes},
title = {A Semantic Model of Program Faults},
booktitle = {Proceedings of the International Symposium on Software Testing and Analysis (ISSTA'96)},
year = {1996},
address = {San Diego, California},
month = {January},
pages = {195-200}
} |
| 715 | Kuo-Chung Tai Theory of Fault-based Predicate Testing for Computer Programs IEEE Transactions on Software Engineering, 22(8), August 1996. |
|
| | Abstract: Predicates appear in both the specification and implementation of a program. One approach to software testing, referred to as predicate testing, is to require certain types of tests for a predicate. In this paper, three fault-based testing criteria are defined for compound predicates, which are predicates with one or more AND/OR operators. BOR (boolean operator) testing requires a set of tests to guarantee the detection of (single or multiple) boolean operator faults, including incorrect AND/OR operators and missing/extra NOT operators. BRO (boolean and relational operator) testing requires a set of tests to guarantee the detection of boolean operator faults and relational operator faults (i.e., incorrect relational operators). BRE (boolean and relational expression) testing requires a set of tests to guarantee the detection of boolean operator faults, relational operator faults, and a type of fault involving arithmetical expressions. It is shown that for a compound predicate with n, n > 0, AND/OR operators, at most n + 2 constraints are needed for BOR testing and at most 2 * n + 3 constraints for BRO or BRE testing, where each constraint specifies a restriction on the value of each boolean variable or relational expression in the predicate. Algorithms for generating a minimum set of constraints for BOR, BRO, and BRE testing of a compound predicate are given, and the feasibility problem for the generated constraints is discussed. For boolean expressions that contain multiple occurrences of some boolean variables, how to combine BOR testing with the meaningful impact strategy developed by Weyuker, Goradia, and Singh [21] is briefly described. |
| | @ARTICLE{Tai06,
author = {Kuo-Chung Tai},
title = {Theory of Fault-based Predicate Testing for Computer Programs},
journal = {IEEE Transactions on Software Engineering},
year = {1996},
month = {August},
volume = {22},
number = {8},
pages = {552-562}
} |
| 716 | Marcio Eduardo Delamaro and Jose Carlos Maldonado Proteum-A Tool for the Assessment of Test Adequacy for C Programs Proceedings of the Conference on Performability in Computing Systems (PCS'96)New Brunswick, New Jersey, July 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DelamaroM96,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado},
title = {Proteum-A Tool for the Assessment of Test Adequacy for C Programs},
booktitle = {Proceedings of the Conference on Performability in Computing Systems (PCS'96)},
year = {1996},
address = {New Brunswick, New Jersey},
month = {July},
pages = {79-95}
} |
| 717 | Murial Daran and Pascale Th\'evenod-Fosse Software Error Analysis: A Real Case Study Involving Real Faults and Mutations ACM SIGSOFT Software Engineering Notes, 21(3), May 1996. |
|
| | Abstract: The paper reports on a first experimental comparison of software errors generated by real faults and by 1st-order mutations. The experiments were conducted on a program developed by a student from the industrial specification of a critical software from the civil nuclear field. Emphasis was put on the analysis of errors produced upon activation of 12 real faults by focusing on the mechanisms of error creation, masking, and propagation up to failure occurrence, and on the comparison of these errors with those created by 24 mutations. The results involve a total of 3730 errors recorded from program execution traces: 1458 errors were produced by the real faults, and the 2272 others by the mutations. They are in favor of a suitable consistency between errors generated by mutations and by real faults: 85% of the 2272 errors due to the mutations were also produced by the real faults. Moreover, it was observed that although the studied mutations were simple faults, they can create erroneous behaviors as complex as those identified for the real faults. This lends support to the representativeness of errors due to mutations. |
| | @ARTICLE{DaranF96,
author = {Murial Daran and Pascale Th\'evenod-Fosse},
title = {Software Error Analysis: A Real Case Study Involving Real Faults and Mutations},
journal = {ACM SIGSOFT Software Engineering Notes},
year = {1996},
month = {May},
volume = {21},
number = {3},
pages = {158-177}
} |
| 718 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur Integration Testing Using Interface Mutation Proceedings of the seventh International Symposium on Software Reliability Engineering (ISSRE '96)White Plains, New York, 30 October - 02 November 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DelamaroMM96,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Integration Testing Using Interface Mutation},
booktitle = {Proceedings of the seventh International Symposium on Software Reliability Engineering (ISSRE '96)},
year = {1996},
address = {White Plains, New York},
month = {30 October - 02 November},
pages = {112-121}
} |
| 719 | Spyros Xanthakis and Constantinos Karapoulios and Regis Pajot and Ahmed Rozz Immune System and Fault-tolerant Computing Proceedings of the European conference on Artificial Evolution (AE'95)Brest, France, 4–6 September 1996. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{XanthakisKPR96,
author = {Spyros Xanthakis and Constantinos Karapoulios and Regis Pajot and Ahmed Rozz},
title = {Immune System and Fault-tolerant Computing},
booktitle = {Proceedings of the European conference on Artificial Evolution (AE'95)},
year = {1996},
address = {Brest, France},
month = {4–6 September},
pages = {181-197}
} |
| 720 | A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang An Experimental Evaluation of Data Flow and Mutation Testing Softw., Pract. Exper., 26(2), 1996. |
|
| | Abstract: Available soon... |
| | @ARTICLE{OffuttPTZ96,
author = {A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang},
title = {An Experimental Evaluation of Data Flow and Mutation Testing},
journal = {Softw., Pract. Exper.},
year = {1996},
month = {},
volume = {26},
number = {2},
pages = {165--176}
} |