| 321 | Leonardo Bottaci
Type Sensitive Application of Mutation Operators for Dynamically Typed Programs
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Bottaci10,
author = {Leonardo Bottaci},
title = {Type Sensitive Application of Mutation Operators for Dynamically Typed Programs},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings},
year = {2010},
address = {},
month = {},
pages = {126--131}
} |
| 322 | Mike Papadakis and Nicos Malevris and Maria Kallia
Towards automating the generation of mutation tests
The 5th Workshop on Automation of Software Test, {AST} 2010, May 3-4, 2010, Cape Town, South Africa, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{PapadakisMK10,
author = {Mike Papadakis and Nicos Malevris and Maria Kallia},
title = {Towards automating the generation of mutation tests},
booktitle = {The 5th Workshop on Automation of Software Test, {AST} 2010, May 3-4, 2010, Cape Town, South Africa},
year = {2010},
address = {},
month = {},
pages = {111--118}
} |
| 323 | David Schuler and Andreas Zeller
(Un-)Covering Equivalent Mutants
Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{SchulerZ10,
author = {David Schuler and Andreas Zeller},
title = {(Un-)Covering Equivalent Mutants},
booktitle = {Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
| 324 | Sergio Segura and Robert M. Hierons and David Benavides and Antonio Ruiz-Cortes
Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach
Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)Paris, France, 6 April 2010. |
|
| | Abstract: A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic involving a number of analysis operations, algorithms, paradigms and tools. Implementing these operations is far from trivial and easily leads to errors and defects in analysis solutions. Current testing methods in this context mainly rely on the ability of the tester to decide whether the output of an analysis is correct. However, this is acknowledged to be time-consuming, error-prone and in most cases infeasible due to the combinatorial complexity of the analyses.
In this paper, we present a set of relations (so-called metamorphic relations) between input FMs and their set of products and a test data generator relying on them. Given an FM and its known set of products, a set of neighbour FMs together with their corresponding set of products are automatically generated and used for testing different analyses. Complex FMs representing millions of products can be efficiently created applying this process iteratively. The evaluation of our approach using mutation testing as well as real faults and tools reveals that most faults can be automatically detected within a few seconds. |
| | @INPROCEEDINGS{SeguraHBR10,
author = {Sergio Segura and Robert M. Hierons and David Benavides and Antonio Ruiz-Cortes},
title = {Automated Test Data Generation on the Analyses of Feature Models: A Metamorphic Testing Approach},
booktitle = {Proceedings of the 3rd International Conference on Software Testing Verification and Validation (ICST'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {35-44}
} |
| 325 | Mark Trakhtenbrot
Implementation-Oriented Mutation Testing of Statechart Models
Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Trakhtenbrot10,
author = {Mark Trakhtenbrot},
title = {Implementation-Oriented Mutation Testing of Statechart Models},
booktitle = {Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
| 326 | Santosh Kumar Swain and Durga Prasad Mohapatra and Rajib Mall
Test Case Generation Based on State and Activity Models
Journal of Object Technology, 9(5), 2010. |
|
| | Abstract: Available soon... |
| | @ARTICLE{swain_JOT_10,
author = {Santosh Kumar Swain and Durga Prasad Mohapatra and Rajib Mall},
title = {Test Case Generation Based on State and Activity Models},
journal = {Journal of Object Technology},
year = {2010},
month = {},
volume = {9},
number = {5},
pages = {1--27}
} |
| 327 | Mark Harman and Yue Jia and William B. Langdon
A Manifesto for Higher Order Mutation Testing
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJL10,
author = {Mark Harman and Yue Jia and William B. Langdon},
title = {A Manifesto for Higher Order Mutation Testing},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings},
year = {2010},
address = {},
month = {},
pages = {80--89}
} |
| 328 | David Schuler and Andreas Zeller
(Un-)Covering Equivalent Mutants
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{SchulerZ10,
author = {David Schuler and Andreas Zeller},
title = {(Un-)Covering Equivalent Mutants},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010},
year = {2010},
address = {},
month = {},
pages = {45--54}
} |
| 329 | John A. Clark and Haitao Dan and Robert M. Hierons
Semantic Mutation Testing
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ClarkDH10,
author = {John A. Clark and Haitao Dan and Robert M. Hierons},
title = {Semantic Mutation Testing},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings},
year = {2010},
address = {},
month = {},
pages = {100--109}
} |
| 330 | Mark Harman and Yue Jia and William Bill Langdon
A Manifesto for Higher Order Mutation Testing
Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJL10,
author = {Mark Harman and Yue Jia and William Bill Langdon},
title = {A Manifesto for Higher Order Mutation Testing},
booktitle = {Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
