| 621 | Yu{-}Seung Ma and Yong Rae Kwon and Jeff Offutt Inter-Class Mutation Operators for Java 13th International Symposium on Software Reliability Engineering {(ISSRE} 2002), 12-15 November 2002, Annapolis, MD, {USA}, 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MaKO02,
author = {Yu{-}Seung Ma and Yong Rae Kwon and Jeff Offutt},
title = {Inter-Class Mutation Operators for Java},
booktitle = {13th International Symposium on Software Reliability Engineering {(ISSRE} 2002), 12-15 November 2002, Annapolis, MD, {USA}},
year = {2002},
address = {},
month = {},
pages = {352--366}
} |
| 622 | Branson W. Murrill and Larry Joe Morell and Erika Mir Olimpiew A Perturbation-based Testing Strategy Proceedings of the 8th International Conference on Engineering of Complex Computer Systems2-4 December, Greenbelt, Maryland 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MurrillMO02,
author = {Branson W. Murrill and Larry Joe Morell and Erika Mir Olimpiew},
title = {A Perturbation-based Testing Strategy},
booktitle = {Proceedings of the 8th International Conference on Engineering of Complex Computer Systems},
year = {2002},
address = {2-4 December},
month = {Greenbelt, Maryland},
pages = {145}
} |
| 623 | Sudipto Ghosh Towards Measurement of Testability of Concurrent Object-oriented Programs Using Fault Insertion: a Preliminary Investigation Proceedings of the 2nd IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)Los Alamitos, California, 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Ghosh02,
author = {Sudipto Ghosh},
title = {Towards Measurement of Testability of Concurrent Object-oriented Programs Using Fault Insertion: a Preliminary Investigation},
booktitle = {Proceedings of the 2nd IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)},
year = {2002},
address = {Los Alamitos, California},
month = {},
pages = {7}
} |
| 624 | Roger T. Alexander and James M. Bieman and Sudipto Ghosh and Bixia Ji Mutation of Java Objects Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002. |
|
| | Abstract: Fault insertion based techniques have been used for measuring test adequacy and testability of programs. Mutation analysis inserts faults into a program with the goal of creating mutation-adequate test sets that distinguish the mutant from the original program. Software testability is measured by calculating the probability that a program will fail on the next test input coming from a predefined input distribution, given that the software includes a fault. Inserted faults must represent plausible errors. It is relatively easy to apply standard transformations to mutate scalar values such as integers, floats, and character data, because their semantics are well understood. Mutating objects that are instances of user defined types is more difficult. There is no obvious way to modify such objects in a manner consistent with realistic faults, without writing custom mutation methods for each object class. We propose a new object mutation approach along with a set of mutation operators and support tools for inserting faults into objects that instantiate items from common Java libraries heavily used in commercial software as well as user defined classes. Preliminary evaluation of our technique shows that it should be effective for evaluating real-world software testing suites. |
| | @INPROCEEDINGS{AlexanderBGB02,
author = {Roger T. Alexander and James M. Bieman and Sudipto Ghosh and Bixia Ji},
title = {Mutation of Java Objects},
booktitle = {Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)},
year = {2002},
address = {Annapolis, Maryland},
month = {12-15 November},
pages = {341-351}
} |
| 625 | Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon Automatic Test Case Optimization Using a Bacteriological Adaptation Model: Application to .NET Components Proceedings of the 17th IEEE International Conference on Automated Software Engineering (ASE'02)Edinburgh, Scotland, 23-27 September 2002. |
|
| | Abstract: In this paper, we present several complementary computational intelligence techniques that we explored in the field of .Net component testing. Mutation testing serves as the common backbone for applying classical and new artificial intelligence (AI) algorithms. With mutation tools, we know how to estimate the revealing power of test cases. With AI, we aim at automatically improving test case efficiency. We therefore looked first at genetic algorithms (GA) to solve the problem of test. The aim of the selection process is to generate test cases able to kill as many mutants as possible. We then propose a new AI algorithm that fits better to the test optimization problem, called bacteriological algorithm (BA): BAs behave better that GAs for this problem. However, between GAs and BAs, a family of intermediate algorithms exists: we explore the whole spectrum of these intermediate algorithms to determine whether an algorithm exists that would be more efficient than BAs.: the approaches are compared on a .Net system. |
| | @INPROCEEDINGS{BaudryFJT02,
author = {Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon},
title = {Automatic Test Case Optimization Using a Bacteriological Adaptation Model: Application to .NET Components},
booktitle = {Proceedings of the 17th IEEE International Conference on Automated Software Engineering (ASE'02)},
year = {2002},
address = {Edinburgh, Scotland},
month = {23-27 September},
pages = {253-256}
} |
| 626 | P. Chevalley and Pascale Th\'evenod-Fosse A Mutation Analysis Tool for Java Programs International Journal on Software Tools for Technology Transfer, 5(1), November 2002. |
|
| | Abstract: Program mutation is a fault-based technique for measuring the effectiveness of test cases that, although powerful, is computationally expensive. The principal expense of mutation is that many faulty versions of the program under test, called mutants, must be created and repeatedly executed. This paper describes a tool, called JavaMut, that implements 26 traditional and object-oriented mutation operators for supporting mutation analysis of Java programs. The current version of that tool is based on syntactic analysis and reflection for implementing mutation operators. JavaMut is interactive; it provides a graphical user interface to make mutation analysis faster and less painful. Thanks to such automated tools, mutation analysis should be achieved within reasonable costs. |
| | @ARTICLE{ChevalleyT02,
author = {P. Chevalley and Pascale Th\'evenod-Fosse},
title = {A Mutation Analysis Tool for Java Programs},
journal = {International Journal on Software Tools for Technology Transfer},
year = {2002},
month = {November},
volume = {5},
number = {1},
pages = {90-103}
} |
| 627 | P. Vilela and M. Machado and W. Eric Wong Testing for Security Vulnerabilities in Software Software Engineering and Applications, 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{VilelaMW02,
author = {P. Vilela and M. Machado and W. Eric Wong},
title = {Testing for Security Vulnerabilities in Software},
booktitle = {Software Engineering and Applications},
year = {2002},
address = {},
month = {},
pages = {}
} |
| 628 | Guido Wimmel and Jan Jurjens Specification-Based Test Generation for Security-Critical Systems Using Mutations Proceedings of the 4th International Conference on Formal Engineering Methods (ICFEM'02)Shanghai, China, 21-25 October 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WimmelJ02,
author = {Guido Wimmel and Jan Jurjens},
title = {Specification-Based Test Generation for Security-Critical Systems Using Mutations},
booktitle = {Proceedings of the 4th International Conference on Formal Engineering Methods (ICFEM'02)},
year = {2002},
address = {Shanghai, China},
month = {21-25 October},
pages = {471 - 482}
} |
| 629 | Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002. |
|
| | Abstract: The level of confidence in a software component is often linked to the quality of its test cases. This quality can in turn be evaluated with mutation analysis: faulty components (mutants) are systematically generated to check the proportion of mutants detected ("killed") by the test cases. But while the generation of basic test cases set is easy, improving its quality may require prohibitive effort. This paper focuses on the issue of automating the test optimization. We looked at genetic algorithms to solve this problem and modeled it as follows: a test case can be considered as a predator while a mutant program is analogous to a prey. The aim of the selection process is to generate test cases able to kill as many mutants as possible. To overcome disappointing experimentation results on the studied .Net system, we propose a slight variation on this idea, no longer at the "animal" level (lions killing zebras) but at the bacteriological level. The bacteriological level indeed better reflects the test case optimization issue: it introduces of a memorization function and the suppresses the crossover operator. We describe this model and show how it behaves on the case study. |
| | @INPROCEEDINGS{BaudryFJT02a,
author = {Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon},
title = {Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment},
booktitle = {Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)},
year = {2002},
address = {Annapolis, Maryland},
month = {12-15 November},
pages = {195-206}
} |
| 630 | Roger T. Alexander and A. Jefferson Offutt and James M. Bieman Syntactic Fault Patterns in OO Programs Proceedings of the 8th International Conference on Engineering of Complex Computer Systems (ICECCS'02)Greenbelt, Maryland, 2-4 December 2002. |
|
| | Abstract: Although program faults are widely studied, there are many aspects of faults that we still do not understand, particularly about OO software. In addition to the simple fact that one important goal during testing is to cause failures and thereby detect faults, a full understanding of the characteristics of faults is crucial to several research areas. The power that inheritance and polymorphism brings to the expressiveness of programming languages also brings a number of new anomalies and fault types. In prior work we presented a fault model for the appearance and realization of OO faults that are specific to the use of inheritance and polymorphism. Many of these faults cannot appear unless certain syntactic patterns are used. The patterns are based on language constructs, such as overriding methods that directly define inherited state variables and non-inherited methods that call inherited methods. If one of these syntactic patterns is used, then we say the software contains an anomaly and possibly a fault. We describe the syntactic patterns for each OO fault type. These syntactic patterns can potentially be found with an automatic tool. Thus, faults can be uncovered and removed early in development. |
| | @INPROCEEDINGS{AlexanderOB02,
author = {Roger T. Alexander and A. Jefferson Offutt and James M. Bieman},
title = {Syntactic Fault Patterns in OO Programs},
booktitle = {Proceedings of the 8th International Conference on Engineering of Complex Computer Systems (ICECCS'02)},
year = {2002},
address = {Greenbelt, Maryland},
month = {2-4 December},
pages = {193-202}
} |
| 631 | Yu-Seung Ma and Yong-Rae Kwon and A. Jefferson Offutt Inter-class Mutation Operators for Java Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)Annapolis, Maryland, 12-15 November 2002. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MaKO02,
author = {Yu-Seung Ma and Yong-Rae Kwon and A. Jefferson Offutt},
title = {Inter-class Mutation Operators for Java},
booktitle = {Proceedings of the 13th International Symposium on Software Reliability Engineering (ISSRE'02)},
year = {2002},
address = {Annapolis, Maryland},
month = {12-15 November},
pages = {352}
} |
| 632 | Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites? Software Testing, Verification and Reliability, 12(4), December 2002. |
|
| | Abstract: Code-coverage-based test data adequacy criteria typically treat all coverable code elements (such as statements, basic blocks or outcomes of decisions) as equal. In practice, however, the probability that a test case can expose a fault in a code element varies: some faults are more easily revealed than others. Thus, several researchers have suggested that if one could estimate the probability that a fault in a code element will cause a failure, one could use this estimate to determine the number of executions of a code element that are required to achieve a certain level of confidence in that element's correctness. This estimate, in turn, could be used to improve the fault-detection effectiveness of test suites and help testers distribute testing resources more effectively. This conjecture is intriguing; however, like many such conjectures it has never been directly examined empirically. If empirical evidence were to support this conjecture, it would motivate further research into methodologies for obtaining fault-exposure-potential estimates and incorporating them into test data adequacy criteria. This paper reports the results of experiments conducted to investigate the effects of incorporating an estimate of fault-exposure probability into the statement coverage test data adequacy criterion. The results of these experiments, however, ran contrary to the conjectures of previous researchers. Although incorporation of the estimates did produce statistically significant increases in the fault-detection effectiveness of test suites, these increases were quite small, suggesting that the approach might not be able to produce the gains hoped for and might not be worth the cost of its employment. |
| | @ARTICLE{ChenURER02,
author = {Wei Chen and Roland H. Untch and Gregg Rothermel and Sebastian Elbaum and Jeffery von Ronne},
title = {Can Fault-Exposure-Potential Estimates Improve the Fault Detection Abilities of Test Suites?},
journal = {Software Testing, Verification and Reliability},
year = {2002},
month = {December},
volume = {12},
number = {4},
pages = {197-218}
} |
| 633 | P. Chevalley Applying Mutation Analysis for Object-oriented Programs Using a Reflective Approach Proceedings of the 8th Asia-Pacific Software Engineering Conference (APSEC 01)Macau, China, 4-7 December 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Chevalley01,
author = {P. Chevalley},
title = {Applying Mutation Analysis for Object-oriented Programs Using a Reflective Approach},
booktitle = {Proceedings of the 8th Asia-Pacific Software Engineering Conference (APSEC 01)},
year = {2001},
address = {Macau, China},
month = {4-7 December},
pages = {267}
} |
| 634 | T. Y. Chen and T. H. Tse and Zhiquan Zhou Fault-Based Testing in the Absence of an Oracle Proceedings of the 25th International Computer Software and Applications Conference on Invigorating Software Development (COMPSAC'01)Chicago, Illinois, 08-12 October 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ChenTZ01,
author = {T. Y. Chen and T. H. Tse and Zhiquan Zhou},
title = {Fault-Based Testing in the Absence of an Oracle},
booktitle = {Proceedings of the 25th International Computer Software and Applications Conference on Invigorating Software Development (COMPSAC'01)},
year = {2001},
address = {Chicago, Illinois},
month = {08-12 October},
pages = {172}
} |
| 635 | Qiushuang Zhang, Ian G. Harris A Validation Fault Model for Timing-Induced Functional Errors Proceedings of the International Test Conference 2001 (ITC'01)Baltimore, Maryland, 30 October- 01 November 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ZhangH01,
author = {Qiushuang Zhang, Ian G. Harris},
title = {A Validation Fault Model for Timing-Induced Functional Errors},
booktitle = {Proceedings of the International Test Conference 2001 (ITC'01)},
year = {2001},
address = {Baltimore, Maryland},
month = {30 October- 01 November},
pages = {813}
} |
| 636 | Ivan Moore Jester - a JUnit test tester Proceeding of eXtreme Programming Conference (XP'01), 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Moore01,
author = {Ivan Moore},
title = {Jester - a JUnit test tester},
booktitle = {Proceeding of eXtreme Programming Conference (XP'01)},
year = {2001},
address = {},
month = {},
pages = {}
} |
| 637 | Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur Interface Mutation: An Approach for Integration Testing IEEE Transactions on Software Engineering, 27(3), May 2001. |
|
| | Abstract: The need for test adequacy criteria is widely recognized. Several criteria have been proposed for the assessment of adequacy of tests at the unit level. However, there remains a lack of criteria for the assessment of the adequacy of tests generated during integration testing. We present a mutation based interprocedural criterion, named Interface Mutation (IM), suitable for use during integration testing. A case study to evaluate the proposed criterion is reported. In the study, the UNIX sort utility was seeded with errors and Interface Mutation evaluated by measuring the cost of its application and its error revealing effectiveness. Alternative IM criteria using different sets of Interface Mutation operators were also evaluated. While comparing the error revealing effectiveness of these Interface Mutation-based test sets with same size randomly generated test sets, we observed that in most cases Interface Mutation based test sets are superior. The results suggest that Interface Mutation offers a viable test adequacy criteria for use at the integration level. |
| | @ARTICLE{DelamaroMM01,
author = {Marcio Eduardo Delamaro and Jose Carlos Maldonado and Aditya P. Mathur},
title = {Interface Mutation: An Approach for Integration Testing},
journal = {IEEE Transactions on Software Engineering},
year = {2001},
month = {May},
volume = {27},
number = {3},
pages = {228-247}
} |
| 638 | T. Olsson and P. Runeson System Level Mutation Analysis Applied to a State-based Language Proceedings of the 8th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ECBS'01)Washington DC, 17-20 April 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OlssonR01,
author = {T. Olsson and P. Runeson},
title = {System Level Mutation Analysis Applied to a State-based Language},
booktitle = {Proceedings of the 8th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ECBS'01)},
year = {2001},
address = {Washington DC},
month = {17-20 April},
pages = {222}
} |
| 639 | Suet Chun Lee and A. Jefferson Offutt Generating Test Cases for XML-Based Web Component Interactions Using Mutation Analysis Proceedings of the 12th International Symposium on Software Reliability Engineering (ISSRE'01)Hong Kong, China, November 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{LeeO01,
author = {Suet Chun Lee and A. Jefferson Offutt},
title = {Generating Test Cases for XML-Based Web Component Interactions Using Mutation Analysis},
booktitle = {Proceedings of the 12th International Symposium on Software Reliability Engineering (ISSRE'01)},
year = {2001},
address = {Hong Kong, China},
month = {November},
pages = {200-209}
} |
| 640 | A. Jefferson Offutt and Roland H. Untch Mutation 2000: Uniting the Orthogonal Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)San Jose, California, 6-7 October 2001. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{OffuttU01,
author = {A. Jefferson Offutt and Roland H. Untch},
title = {Mutation 2000: Uniting the Orthogonal},
booktitle = {Proceedings of the 1st Workshop on Mutation Analysis (MUTATION'00)},
year = {2001},
address = {San Jose, California},
month = {6-7 October},
pages = {34-44}
} |