| 561 | Prasanth Anbalagan and Tao Xie Efficient Mutant Generation for Mutation Testing of Pointcuts in Aspect-Oriented Programs Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006. |
|
| | Abstract: Fault-based testing is an approach where the designed test data is used to demonstrate the absence of a set of prespecified faults, typically being frequently occurring faults. Mutation testing is a fault-based testing technique used to inject faults into an existing program, i.e., a variation of the original program and see if the test suite is sensitive enough to detect common faults. Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, a language designed to support AOP uses abstractions like pointcuts, advice, and aspects to achieve AOP's primary functionality. Developers tend to write pointcut expressions with incorrect strength, thereby selecting additional events than intended to or leaving out necessary events. This incorrect strength causes aspects, the set of crosscutting concerns, to fail. Hence there is a need to test the pointcuts for their strength. Mutation testing of pointcuts includes two steps: creating effective mutants (variations) of a pointcut expression and testing these mutants using the designed test data. The number of mutants for a pointcut expression is usually large due to the usage of wildcards. It is tedious to manually identify effective mutants that are of appropriate strength and resemble closely the original pointcut expression. Our framework automatically generates mutants for a pointcut expression and identifies mutants that resemble closely the original expression. Then the developers could use the test data for the woven classes against these mutants to perform mutation testing. |
| | @INPROCEEDINGS{AnbalaganX06,
author = {Prasanth Anbalagan and Tao Xie},
title = {Efficient Mutant Generation for Mutation Testing of Pointcuts in Aspect-Oriented Programs},
booktitle = {Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)},
year = {2006},
address = {Raleigh, North Carolina},
month = {November},
pages = {3}
} |
| 562 | Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon Automatic Test Case Optimization: A Bacteriologic Algorithm IEEE Software, 22(2), March-April 2005. |
|
| | Abstract: Improving test cases automatically is a nonlinear optimization problem. To solve this problem, we've developed a bacteriologic algorithm, adapted from genetic algorithms that can generate and optimize a set of test cases. A .NET component that parses C# source files illustrates our algorithm. |
| | @ARTICLE{BaudryFJT05a,
author = {Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon},
title = {Automatic Test Case Optimization: A Bacteriologic Algorithm},
journal = {IEEE Software},
year = {2005},
month = {March-April},
volume = {22},
number = {2},
pages = {76-82}
} |
| 563 | Yuan Zhan and John A. Clark Search-based mutation testing for \emph{Simulink} models Genetic and Evolutionary Computation Conference, {GECCO} 2005, Proceedings, Washington DC, USA, June 25-29, 2005, 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{zhan_GECCO_05,
author = {Yuan Zhan and John A. Clark},
title = {Search-based mutation testing for \emph{Simulink} models},
booktitle = {Genetic and Evolutionary Computation Conference, {GECCO} 2005, Proceedings, Washington DC, USA, June 25-29, 2005},
year = {2005},
address = {},
month = {},
pages = {1061--1068}
} |
| 564 | Md. Mehedi Masud and Amiya Nayak and Marzia Zaman and Nita Bansal Strategy for Mutation Testing Using Genetic Algorithms Proceedings of the Canadian Conference on Electrical and Computer Engineering (CCECE '05)Montreal, Quebec, 1-4 May 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{MasudNZB05,
author = {Md. Mehedi Masud and Amiya Nayak and Marzia Zaman and Nita Bansal},
title = {Strategy for Mutation Testing Using Genetic Algorithms},
booktitle = {Proceedings of the Canadian Conference on Electrical and Computer Engineering (CCECE '05)},
year = {2005},
address = {Montreal, Quebec},
month = {1-4 May},
pages = {1049-1052}
} |
| 565 | Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon From Genetic to Bacteriological Algorithms for Mutation-based Testing Software Testing, Verification and Reliability, 15(2), June 2005. |
|
| | Abstract: The level of confidence in a software component is often linked to the quality of its test cases. This quality can in turn be evaluated with mutation analysis: faults are injected into the software component (making mutants of it) to check the proportion of mutants detected (‘killed’) by the test cases. But while the generation of a set of basic test cases is easy, improving its quality may require prohibitive effort. This paper focuses on the issue of automating the test optimization. The application of genetic algorithms would appear to be an interesting way of tackling it. The optimization problem is modelled as follows: a test case can be considered as a predator while a mutant program is analogous to a prey. The aim of the selection process is to generate test cases able to kill as many mutants as possible, starting from an initial set of predators, which is the test cases set provided by the programmer. To overcome disappointing experimentation results, on .Net components and unit Eiffel classes, a slight variation on this idea is studied, no longer at the ‘animal’ level (lions killing zebras, say) but at the bacteriological level. The bacteriological level indeed better reflects the test case optimization issue: it mainly differs from the genetic one by the introduction of a memorization function and the suppression of the crossover operator. The purpose of this paper is to explain how the genetic algorithms have been adapted to fit with the issue of test optimization. The resulting algorithm differs so much from genetic algorithms that it has been given another name: bacteriological algorithm. |
| | @ARTICLE{BaudryFJT05,
author = {Benoit Baudry and Franck Fleurey and Jean-Marc Jezequel and Yves Le Traon},
title = {From Genetic to Bacteriological Algorithms for Mutation-based Testing},
journal = {Software Testing, Verification and Reliability},
year = {2005},
month = {June},
volume = {15},
number = {2},
pages = {73 - 96}
} |
| 566 | Man F. Lau and Yuen T. Yu An Extended Fault Class Hierarchy for Specification-based Testing ACM Transactions on Software Engineering and Methodology, 14(3), July 2005. |
|
| | Abstract: Kuhn, followed by Tsuchiya and Kikuno, have developed a hierarchy of relationships among several common types of faults (such as variable and expression faults) for specification-based testing by studying the corresponding fault detection conditions. Their analytical results can help explain the relative effectiveness of various fault-based testing techniques previously proposed in the literature. This article extends and complements their studies by analyzing the relationships between variable and literal faults, and among literal, operator, term, and expression faults. Our analysis is more comprehensive and produces a richer set of findings that interpret previous empirical results, can be applied to the design and evaluation of test methods, and inform the way that test cases should be prioritized for earlier detection of faults. Although this work originated from the detection of faults related to specifications, our results are equally applicable to program-based predicate testing that involves logic expressions. |
| | @ARTICLE{LauY05,
author = {Man F. Lau and Yuen T. Yu},
title = {An Extended Fault Class Hierarchy for Specification-based Testing},
journal = {ACM Transactions on Software Engineering and Methodology},
year = {2005},
month = {July},
volume = {14},
number = {3},
pages = {247-276}
} |
| 567 | Ying Jiang and Shan-Shan Hou and Jin-Hui Shan and Lu Zhang and Bing Xie Contract-Based Mutation for Testing Components Proceedings of the 21st IEEE International Conference on Software Maintenance (ICSM'05)Budapest, Hungary, 25-30 September 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{JiangHSZX05,
author = {Ying Jiang and Shan-Shan Hou and Jin-Hui Shan and Lu Zhang and Bing Xie},
title = {Contract-Based Mutation for Testing Components},
booktitle = {Proceedings of the 21st IEEE International Conference on Software Maintenance (ICSM'05)},
year = {2005},
address = {Budapest, Hungary},
month = {25-30 September},
pages = {483-492}
} |
| 568 | Anna Derezi\'nska Advanced Mutation Operators Applicable in C\# Programs Warsaw University of Technology, Warszawa, Poland, 2005. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{Derezinska05,
author = {Anna Derezi\'nska},
title = {Advanced Mutation Operators Applicable in C\# Programs},
institution = {Warsaw University of Technology},
year = {2005},
type = {techreport},
number = {},
address = {Warszawa, Poland},
month = {},
} |
| 569 | Mike Papadakis Error detection methods in Java Programs using the mutation method Athens University of Economics and Business, , 2005. |
|
| | Abstract: Available soon... |
| | @MASTERSTHESIS{PapadakisMS,
author = {Mike Papadakis},
title = {Error detection methods in Java Programs using the mutation method},
school = {Athens University of Economics and Business},
year = {2005},
type = {mastersthesis},
address = {},
month = {June},
} |
| 570 | Kalpesh Kapoor and Jonathan P. Bowen Ordering Mutants to Minimise Test Effort in Mutation Testing Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)Linz, Austria, 21 September 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{KapoorB05,
author = {Kalpesh Kapoor and Jonathan P. Bowen},
title = {Ordering Mutants to Minimise Test Effort in Mutation Testing},
booktitle = {Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)},
year = {2005},
address = {Linz, Austria},
month = {21 September},
pages = {195-209}
} |
| 571 | Yu{-}Seung Ma and Jeff Offutt and Yong Rae Kwon MuJava: an automated class mutation system Softw. Test., Verif. Reliab., 15(2), 2005. |
|
| | Abstract: Available soon... |
| | @ARTICLE{MaOK05,
author = {Yu{-}Seung Ma and Jeff Offutt and Yong Rae Kwon},
title = {MuJava: an automated class mutation system},
journal = {Softw. Test., Verif. Reliab.},
year = {2005},
month = {},
volume = {15},
number = {2},
pages = {97--133}
} |
| 572 | Yu-Seung Ma and A. Jefferson Offutt and Yong-Rae Kwon MuJava: An Automated Class Mutation System Software Testing, Verification & Reliability, 15(2), June 2005. |
|
| | Abstract: Several module and class testing techniques have been applied to object-oriented (OO) programs, but researchers have only recently begun developing test criteria that evaluate the use of key OO features such as inheritance, polymorphism, and encapsulation. Mutation testing is a powerful testing technique for generating software tests and evaluating the quality of software. However, the cost of mutation testing has traditionally been so high that it cannot be applied without full automated tool support. This paper presents a method to reduce the execution cost of mutation testing for OO programs by using two key technologies, mutant schemata generation (MSG) and bytecode translation. This method adapts the existing MSG method for mutants that change the program behaviour and uses bytecode translation for mutants that change the program structure. A key advantage is in performance: only two compilations are required and both the compilation and execution time for each is greatly reduced. A mutation tool based on the MSG/bytecode translation method has been built and used to measure the speedup over the separate compilation approach. Experimental results show that the MSG/bytecode translation method is about five times faster than separate compilation. |
| | @ARTICLE{MaOK05,
author = {Yu-Seung Ma and A. Jefferson Offutt and Yong-Rae Kwon},
title = {MuJava: An Automated Class Mutation System},
journal = {Software Testing, Verification & Reliability},
year = {2005},
month = {June},
volume = {15},
number = {2},
pages = {97-133}
} |
| 573 | Yuan Zhan and John A. Clark Search-based Mutation Testing for Simulink Models Proceedings of the Conference on Genetic and Evolutionary Computation (GECCO'05)Washington DC, USA, 25-29 June 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ZhanC05,
author = {Yuan Zhan and John A. Clark},
title = {Search-based Mutation Testing for Simulink Models},
booktitle = {Proceedings of the Conference on Genetic and Evolutionary Computation (GECCO'05)},
year = {2005},
address = {Washington DC, USA},
month = {25-29 June},
pages = {1061-1068}
} |
| 574 | Bernhard K. Aichernig and Percy Antonio Pari Salas Test Case Generation by OCL Mutation and Constraint Solving Proceedings of the 5th International Conference on Quality Software (QSIC'05)Melbourne, Australia, 19-20 September 2005. |
|
| | Abstract: Fault-based testing is a technique where testers anticipate errors in a system under test in order to assess or generate test cases. The idea is to have enough test cases capable of detecting these anticipated errors. This paper presents a method of fault-based test case generation for pre and postcondition specifications. Here, errors are anticipated on the specification level by mutating the pre and postconditions. We present the underlying theory by giving test cases a formal semantics and translate this general testing theory to a constraint satisfaction problem. A prototype test case generator serves to demonstrate the automatization of the method. The current tool works with OCL specifications, but the theory and method are general and apply to many state-based specification languages. |
| | @INPROCEEDINGS{AichernigS05,
author = {Bernhard K. Aichernig and Percy Antonio Pari Salas},
title = {Test Case Generation by OCL Mutation and Constraint Solving},
booktitle = {Proceedings of the 5th International Conference on Quality Software (QSIC'05)},
year = {2005},
address = {Melbourne, Australia},
month = {19-20 September},
pages = {64-71}
} |
| 575 | Hoijin Yoon and Eunhee Kim and Joo Young Seo and Byoungju Choi Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)Linz, Austria, 21 September 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{YoonKSC05,
author = {Hoijin Yoon and Eunhee Kim and Joo Young Seo and Byoungju Choi},
title = {Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study},
booktitle = {Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)},
year = {2005},
address = {Linz, Austria},
month = {21 September},
pages = {210-224}
} |
| 576 | James H. Andrews and Lionel C. Briand and Yvan Labiche Is mutation an appropriate tool for testing experiments? 27th International Conference on Software Engineering {(ICSE} 2005), 15-21 May 2005, St. Louis, Missouri, {USA}, 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{andrews_ICSE_05_mutgen,
author = {James H. Andrews and Lionel C. Briand and Yvan Labiche},
title = {Is mutation an appropriate tool for testing experiments?},
booktitle = {27th International Conference on Software Engineering {(ICSE} 2005), 15-21 May 2005, St. Louis, Missouri, {USA}},
year = {2005},
address = {},
month = {},
pages = {402--411}
} |
| 577 | Yu-Seung Ma Object-Oriented Mutation Testing for Java KAIST University in Korea, , 2005.Unknown- |
|
| | Abstract: Available soon... |
| | @PHDTHESIS{Ma05,
author = {Yu-Seung Ma},
title = {Object-Oriented Mutation Testing for Java},
school = {KAIST University in Korea},
year = {2005},
type = {phdthesis},
address = {},
month = {},
} |
| 578 | Amit Paradkar Case Studies on Fault Detection Effectiveness of Model Based Test Generation Techniques Proceedings of the 1st International Workshop on Advances in Model-Based Testing (A-MOST'05)St. Louis, Missouri, 15-16 May 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{Paradkar05,
author = {Amit Paradkar},
title = {Case Studies on Fault Detection Effectiveness of Model Based Test Generation Techniques},
booktitle = {Proceedings of the 1st International Workshop on Advances in Model-Based Testing (A-MOST'05)},
year = {2005},
address = {St. Louis, Missouri},
month = {15-16 May},
pages = {1 - 7}
} |
| 579 | Z. A. Al-Khanjari and Martin R. Woodward and Haider Ali Ramadhan and N. S. Kutti The Efficiency of Critical Slicing in Fault Localization Software Quality Journal, 13(2), June 2005. |
|
| | Abstract: In software testing, developing effective debugging strategies is important to guarantee the reliability of software under testing. A heuristic technique is to cause failure and therefore expose faults. Based on this approach mutation testing has been found very useful technique in detecting faults. However, it suffers from two problems with successfully testing programs: (1) requires extensive computing resources and (2) puts heavy demand on human resources. Later, empirical observations suggest that critical slicing based on Statement Deletion (Sdl) mutation operator has been found the most effective technique in reducing effort and the required computing resources in locating the program faults. The second problem of mutation testing may be solved by automating the program testing with the help of software tools. Our study focuses on determining the effectiveness of the critical slicing technique with the help of the Mothra Mutation Testing System in detecting program faults. This paper presents the results showing the performance of Mothra Mutation Testing System through conducting critical slicing testing on a selected suite of programs. |
| | @ARTICLE{KhanjariWRK05,
author = {Z. A. Al-Khanjari and Martin R. Woodward and Haider Ali Ramadhan and N. S. Kutti},
title = {The Efficiency of Critical Slicing in Fault Localization},
journal = {Software Quality Journal},
year = {2005},
month = {June},
volume = {13},
number = {2},
pages = {129-153}
} |
| 580 | W. K. Chan and S. C. Cheung and T. H. Tse Fault-Based Testing of Database Application Programs with Conceptual Data Model Proceedings of the 5th International Conference on Quality Software (QSIC'05)Melbourne, Australia, 19 -20 September 2005. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{ChanCT05,
author = {W. K. Chan and S. C. Cheung and T. H. Tse},
title = {Fault-Based Testing of Database Application Programs with Conceptual Data Model},
booktitle = {Proceedings of the 5th International Conference on Quality Software (QSIC'05)},
year = {2005},
address = {Melbourne, Australia},
month = {19 -20 September},
pages = {187-196}
} |