Mutation Testing Publications

Search results for "all papers", found 857 papers, 43 pages

541Sagar Sen and Benoit Baudry
Mutation-based Model Synthesis in Model Driven Engineering
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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542Youssef Serrestou and Vincent Beroulle and Chantal Robach
How to Improve a Set of Design Validation Data by Using Mutation-Based Test
Proceedings of the IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS'06)Prague, Czech Republic, 18-21 April 2006.
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543Jeremy S. Bradbury and James R. Cordy and Juergen Dingel
Mutation Operators for Concurrent Java (J2SE 5.0)
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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544Jeremy S. Bradbury and James R. Cordy and Juergen Dingel
ExMAn: A Generic and Customizable Framework for Experimental Mutation Analysis
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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545James H. Andrews and Lionel C. Briand and Yvan Labiche and Akbar Siami Namin
Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria
IEEE Transactions on Software Engineering, 32(8), August 2006.
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546Ahyoung Sung and Jina Jang and Byoungju Choi
Fault-Based Interface Testing Between Real-Time Operating System and Application
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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547James H. Andrews and Lionel C. Briand and Yvan Labiche and Akbar Siami Namin
Using Mutation Analysis for Assessing and Comparing Testing Coverage Criteria
{IEEE} Trans. Software Eng., 32(8), 2006.
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548Chang-ai Sun and Yunwei Dong and Richard Lai and K. Y. Sim and T. Y. Chen
Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions
Proceedings of the 6th IEEE International Conference on Computer and Information TechnologySeoul, Korea, 20-22 September 2006.
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549Fevzi Belli and Christof J. Budnik and W. Eric Wong
Basic Operations for Generating Behavioral Mutants
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, 2006.
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550Jon S. Baekken and Roger T. Alexander
A Candidate Fault Model for AspectJ Pointcuts
Proceedings of the 17th International Symposium on Software Reliability Engineering (ISSRE'06)Raleigh, North Carolina, 7-10 November 2006.
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551Lijun Shan and Hong Zhu
Testing Software Modelling Tools Using Data Mutation
Proceedings of the International Workshop on Automation of Software Test (AST'06)Shanghai, China, 20-28 May 2006.
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552Benoit Baudry and Franck Fleurey and Yves Le Traon
Improving Test Suites for Efficient Fault Localization
Proceedings of the 28th International Conference on Software Engineering (ICSE'06)Shanghai, China, 20-28 May 2006.
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553R. K. Singh and Pravin Chandra and Yogesh Singh
An Evaluation of Boolean Expression Testing Techniques
ACM SIGSOFT Software Engineering Notes, 31(5), September 2006.
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554Huo Yan Chen and Su Hu
Two New Kinds of Class Level Mutants for Object-Oriented Programs
Proceedings of the IEEE International Conference on Systems, Man and Cybernetics (SMC'06)Taipei, Taiwan, 8-11 October 2006.
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555J. S. Bradbury and J. R. Cordy and J. Dingel
Mutation Operators for Concurrent Java (J2SE 5.0)
Second Workshop on Mutation Analysis (Mutation 2006 - ISSRE Workshops 2006), Nov 2006.
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556Yves Crouzet and Helene Waeselynck and Benjamin Lussier and David Powell
The SESAME Experience: from Assembly Languages to Declarative Models
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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557Akbar Siami Namin and James H. Andrews
Finding Sufficient Mutation Operators via Variable Reduction
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
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558A. Jefferson Offutt and Yu-Seung Ma and Yong-Rae Kwon
The Class-Level Mutants of MuJava
Proceedings of the International Workshop on Automation of Software Test (AST'06)Shanghai, China, 20-28 May 2006.
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559Robert Nilsson and A. Jefferson Offutt and Jonas Mellin
Test Case Generation for Mutation-based Testing of Timeliness
Proceedings of the 2nd Workshop on Model Based Testing (MBT 2006)Vienna, Austria, 25-26 March 2006.
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560A. Jefferson Offutt and Paul Ammann and Lisa (Ling) Liu
Mutation Testing implements Grammar-Based Testing
Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006.
BibTeX | Abstract | URL