| 1 | Mike Papadakis and Marinos Kintis and Jie Zhang and Yue Jia and Yves Le Traon and Mark Harman
Mutation Testing Advances: An Analysis and Survey
Unknown- |
|
| | Abstract: Available soon... |
| | Unknown++ |
| 2 | Fan Wu and Jay Nanavati and Mark Harman and Yue Jia and Jens Krinke
Memory mutation testing
Information {\&} Software Technology, 81(), 2017. |
|
| | Abstract: Available soon... |
| | @ARTICLE{WuNHJK17,
author = {Fan Wu and Jay Nanavati and Mark Harman and Yue Jia and Jens Krinke},
title = {Memory mutation testing},
journal = {Information {\&} Software Technology},
year = {2017},
month = {},
volume = {81},
number = {},
pages = {97--111}
} |
| 3 | Matthew Patrick and Yue Jia
{KD-ART:} Should we intensify or diversify tests to kill mutants?
Information {\&} Software Technology, 81(), 2017. |
|
| | Abstract: Available soon... |
| | @ARTICLE{PatrickJ17,
author = {Matthew Patrick and Yue Jia},
title = {{KD-ART:} Should we intensify or diversify tests to kill mutants?},
journal = {Information {\&} Software Technology},
year = {2017},
month = {},
volume = {81},
number = {},
pages = {36--51}
} |
| 4 | Mike Papadakis and Christopher Henard and Mark Harman and Yue Jia and Yves Le Traon
Threats to the validity of mutation-based test assessment
Proceedings of the 25th International Symposium on Software Testing and Analysis, {ISSTA} 2016, Saarbr{\"{u}}cken, Germany, July 18-20, 2016, 2016. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{PapadakisHHJT16,
author = {Mike Papadakis and Christopher Henard and Mark Harman and Yue Jia and Yves Le Traon},
title = {Threats to the validity of mutation-based test assessment},
booktitle = {Proceedings of the 25th International Symposium on Software Testing and Analysis, {ISSTA} 2016, Saarbr{\"{u}}cken, Germany, July 18-20, 2016},
year = {2016},
address = {},
month = {},
pages = {354--365}
} |
| 5 | Christopher Henard and Mike Papadakis and Mark Harman and Yue Jia and Yves Le Traon
Comparing white-box and black-box test prioritization
Proceedings of the 38th International Conference on Software Engineering, {ICSE} 2016, Austin, TX, USA, May 14-22, 2016, 2016. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{henard_ICSE_16,
author = {Christopher Henard and Mike Papadakis and Mark Harman and Yue Jia and Yves Le Traon},
title = {Comparing white-box and black-box test prioritization},
booktitle = {Proceedings of the 38th International Conference on Software Engineering, {ICSE} 2016, Austin, TX, USA, May 14-22, 2016},
year = {2016},
address = {},
month = {},
pages = {523--534}
} |
| 6 | Fan Wu and Mark Harman and Yue Jia and Jens Krinke
{HOMI:} Searching Higher Order Mutants for Software Improvement
Search Based Software Engineering - 8th International Symposium, {SSBSE} 2016, Raleigh, NC, USA, October 8-10, 2016, Proceedings, 2016. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{WuHJK16,
author = {Fan Wu and Mark Harman and Yue Jia and Jens Krinke},
title = {{HOMI:} Searching Higher Order Mutants for Software Improvement},
booktitle = {Search Based Software Engineering - 8th International Symposium, {SSBSE} 2016, Raleigh, NC, USA, October 8-10, 2016, Proceedings},
year = {2016},
address = {},
month = {},
pages = {18--33}
} |
| 7 | David Bowes and Tracy Hall and Mark Harman and Yue Jia and Federica Sarro and Fan Wu
Mutation-aware fault prediction
Proceedings of the 25th International Symposium on Software Testing and Analysis, {ISSTA} 2016, Saarbr{\"{u}}cken, Germany, July 18-20, 2016, 2016. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{BowesHHJSW16,
author = {David Bowes and Tracy Hall and Mark Harman and Yue Jia and Federica Sarro and Fan Wu},
title = {Mutation-aware fault prediction},
booktitle = {Proceedings of the 25th International Symposium on Software Testing and Analysis, {ISSTA} 2016, Saarbr{\"{u}}cken, Germany, July 18-20, 2016},
year = {2016},
address = {},
month = {},
pages = {330--341}
} |
| 8 | Yue Jia and Fan Wu and Mark Harman and Jens Krinke
Genetic Improvement using Higher Order Mutation
Genetic and Evolutionary Computation Conference, {GECCO} 2015, Madrid, Spain, July 11-15, 2015, Companion Material Proceedings, 2015. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{JiaWHK15,
author = {Yue Jia and Fan Wu and Mark Harman and Jens Krinke},
title = {Genetic Improvement using Higher Order Mutation},
booktitle = {Genetic and Evolutionary Computation Conference, {GECCO} 2015, Madrid, Spain, July 11-15, 2015, Companion Material Proceedings},
year = {2015},
address = {},
month = {},
pages = {803--804}
} |
| 9 | Matthew Patrick and Yue Jia
Kernel Density Adaptive Random Testing
Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015, 2015. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{patrick_ICST_15,
author = {Matthew Patrick and Yue Jia},
title = {Kernel Density Adaptive Random Testing},
booktitle = {Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015},
year = {2015},
address = {},
month = {},
pages = {1--10}
} |
| 10 | Jay Nanavati and Fan Wu and Mark Harman and Yue Jia and Jens Krinke
Mutation testing of memory-related operators
Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015, 2015. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{NanavatiWHJK15,
author = {Jay Nanavati and Fan Wu and Mark Harman and Yue Jia and Jens Krinke},
title = {Mutation testing of memory-related operators},
booktitle = {Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015},
year = {2015},
address = {},
month = {},
pages = {1--10}
} |
| 11 | Mike Papadakis and Yue Jia and Mark Harman and Yves Le Traon
Trivial Compiler Equivalence: {A} Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique
37th {IEEE/ACM} International Conference on Software Engineering, {ICSE} 2015, Florence, Italy, May 16-24, 2015, Volume 1, 2015. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{PapadakisJHT15,
author = {Mike Papadakis and Yue Jia and Mark Harman and Yves Le Traon},
title = {Trivial Compiler Equivalence: {A} Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique},
booktitle = {37th {IEEE/ACM} International Conference on Software Engineering, {ICSE} 2015, Florence, Italy, May 16-24, 2015, Volume 1},
year = {2015},
address = {},
month = {},
pages = {936--946}
} |
| 12 | Xiangjuan Yao and Mark Harman and Yue Jia
A study of equivalent and stubborn mutation operators using human analysis of equivalence
36th International Conference on Software Engineering, {ICSE} '14, Hyderabad, India - May 31 - June 07, 2014, 2014. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{YaoHJ14,
author = {Xiangjuan Yao and Mark Harman and Yue Jia},
title = {A study of equivalent and stubborn mutation operators using human analysis of equivalence},
booktitle = {36th International Conference on Software Engineering, {ICSE} '14, Hyderabad, India - May 31 - June 07, 2014},
year = {2014},
address = {},
month = {},
pages = {919--930}
} |
| 13 | Mark Harman and Yue Jia and Pedro Reales Mateo and Macario Polo
Angels and monsters: an empirical investigation of potential test effectiveness and efficiency improvement from strongly subsuming higher order mutation
{ACM/IEEE} International Conference on Automated Software Engineering, {ASE} '14, Vasteras, Sweden - September 15 - 19, 2014, 2014. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJMP14,
author = {Mark Harman and Yue Jia and Pedro Reales Mateo and Macario Polo},
title = {Angels and monsters: an empirical investigation of potential test effectiveness and efficiency improvement from strongly subsuming higher order mutation},
booktitle = {{ACM/IEEE} International Conference on Automated Software Engineering, {ASE} '14, Vasteras, Sweden - September 15 - 19, 2014},
year = {2014},
address = {},
month = {},
pages = {397--408}
} |
| 14 | Mark Harman and Yue Jia and William B. Langdon
Strong higher order mutation-based test data generation
SIGSOFT/FSE'11 19th {ACM} {SIGSOFT} Symposium on the Foundations of Software Engineering {(FSE-19)} and ESEC'11: 13th European Software Engineering Conference (ESEC-13), Szeged, Hungary, September 5-9, 2011, 2011. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJL11,
author = {Mark Harman and Yue Jia and William B. Langdon},
title = {Strong higher order mutation-based test data generation},
booktitle = {SIGSOFT/FSE'11 19th {ACM} {SIGSOFT} Symposium on the Foundations of Software Engineering {(FSE-19)} and ESEC'11: 13th European Software Engineering Conference (ESEC-13), Szeged, Hungary, September 5-9, 2011},
year = {2011},
address = {},
month = {},
pages = {212--222}
} |
| 15 | Yue Jia and Mark Harman
An Analysis and Survey of the Development of Mutation Testing
{IEEE} Trans. Software Eng., 37(5), 2011. |
|
| | Abstract: Available soon... |
| | @ARTICLE{JiaH11,
author = {Yue Jia and Mark Harman},
title = {An Analysis and Survey of the Development of Mutation Testing},
journal = {{IEEE} Trans. Software Eng.},
year = {2011},
month = {},
volume = {37},
number = {5},
pages = {649--678}
} |
| 16 | William B. Langdon and Mark Harman and Yue Jia
Efficient multi-objective higher order mutation testing with genetic programming
Journal of Systems and Software, 83(12), 2010. |
|
| | Abstract: Available soon... |
| | @ARTICLE{LangdonHJ10,
author = {William B. Langdon and Mark Harman and Yue Jia},
title = {Efficient multi-objective higher order mutation testing with genetic programming},
journal = {Journal of Systems and Software},
year = {2010},
month = {},
volume = {83},
number = {12},
pages = {2416--2430}
} |
| 17 | Mark Harman and Yue Jia and William Bill Langdon
A Manifesto for Higher Order Mutation Testing
Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)Paris, France, 6 April 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJL10,
author = {Mark Harman and Yue Jia and William Bill Langdon},
title = {A Manifesto for Higher Order Mutation Testing},
booktitle = {Proceedings of the 5th International Workshop on Mutation Analysis (MUTATION'10)},
year = {2010},
address = {Paris, France},
month = {6 April},
pages = {}
} |
| 18 | Mark Harman and Yue Jia and William B. Langdon
A Manifesto for Higher Order Mutation Testing
Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings, 2010. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HarmanJL10,
author = {Mark Harman and Yue Jia and William B. Langdon},
title = {A Manifesto for Higher Order Mutation Testing},
booktitle = {Third International Conference on Software Testing, Verification and Validation, {ICST} 2010, Paris, France, April 7-9, 2010, Workshops Proceedings},
year = {2010},
address = {},
month = {},
pages = {80--89}
} |
| 19 | William Bill Langdon and Mark Harman and Yue Jia
Multi Objective Mutation Testing With Genetic Programming
Proceedings of the Genetic and Evolutionary Computation Conference 2009 (GECCO'09)Montr\'eal, Canada, 8-12 July 2009. |
|
| | Abstract: Mutation testing is a powerful software engineering technique for fault finding. It works by injecting known faults (mutations) into software and seeing if the test suite finds them. It remains very expensive and the few valuable traditional mutants that resemble real faults are mixed in with many others that denote unrealistic faults. The expense and lack of realism inhibit industrial uptake of mutation testing. Genetic programming searches the space of complex faults to find realistic higher order mutants. Despite the much larger search space, we have found mutants composed of multiple changes to the C source code that challenge the tester and which cannot be represented in the first order space. |
| | @INPROCEEDINGS{LangdonHJ09,
author = {William Bill Langdon and Mark Harman and Yue Jia},
title = {Multi Objective Mutation Testing With Genetic Programming},
booktitle = {Proceedings of the Genetic and Evolutionary Computation Conference 2009 (GECCO'09)},
year = {2009},
address = {Montr\'eal, Canada},
month = {8-12 July},
pages = {}
} |
| 20 | Yue Jia and Mark Harman
Higher Order Mutation Testing
Information {\&} Software Technology, 51(10), 2009. |
|
| | Abstract: Available soon... |
| | @ARTICLE{JiaH09,
author = {Yue Jia and Mark Harman},
title = {Higher Order Mutation Testing},
journal = {Information {\&} Software Technology},
year = {2009},
month = {},
volume = {51},
number = {10},
pages = {1379--1393}
} |
| 21 | William Bill Langdon and Mark Harman and Yue Jia
Multi Objective Higher Order Mutation Testing With Genetic Programming
Proceedings of the 4th Testing: Academic and Industrial Conference - Practice and Research (TAIC PART'09)Windsor, UK, 4-6 September 2009. |
|
| | Abstract: Mutation testing is a powerful software engineering technique for fault finding. It works by injecting known faults (mutations) into software and seeing if the test suite finds them. It remains very expensive and the few valuable traditional mutants that resemble real faults are mixed in with many others that denote unrealistic faults. The expense and lack of realism inhibit industrial uptake of mutation testing. Genetic programming searches the space of complex faults to find realistic higher order mutants. Despite the much larger search space, we have found mutants composed of multiple changes to the C source code that challenge the tester and which cannot be represented in the first order space. |
| | @INPROCEEDINGS{LangdonHJ09a,
author = {William Bill Langdon and Mark Harman and Yue Jia},
title = {Multi Objective Higher Order Mutation Testing With Genetic Programming},
booktitle = {Proceedings of the 4th Testing: Academic and Industrial Conference - Practice and Research (TAIC PART'09)},
year = {2009},
address = {Windsor, UK},
month = {4-6 September},
pages = {}
} |
| 22 | Yue Jia and Mark Harman
Higher Order Mutation Testing
Journal of Information and Software Technology, 51(10), October 2009. |
|
| | Abstract: This paper introduces a new paradigm for Mutation Testing, which we call Higher Order Mutation Testing (HOM Testing). Traditional Mutation Testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easily killed. Higher order mutants are created by the insertion of two or more faults. The paper introduces the concept of a subsuming HOM; one that is harder to kill than the first order mutants from which it is constructed. By definition, subsuming HOMs denote subtle fault combinations. The paper reports the results of an empirical study of HOM Testing using ten programs, including several non trivial real–world subjects for which test suites are available. |
| | @ARTICLE{JiaH09a,
author = {Yue Jia and Mark Harman},
title = {Higher Order Mutation Testing},
journal = {Journal of Information and Software Technology},
year = {2009},
month = {October},
volume = {51},
number = {10},
pages = {1379-1393}
} |
| 23 | Yue Jia and Mark Harman
An Analysis and Survey of the Development of Mutation Testing
CREST Centre, King's College LondonTR-09-06, London, UK, 2009. |
|
| | Abstract: Available soon... |
| | @TECHREPORT{JiaH09b,
author = {Yue Jia and Mark Harman},
title = {An Analysis and Survey of the Development of Mutation Testing},
institution = {CREST Centre, King's College London},
year = {2009},
type = {techreport},
number = {TR-09-06},
address = {London, UK},
month = {September},
} |
| 24 | Yue Jia and Mark Harman
Constructing Subtle Faults Using Higher Order Mutation Testing
Eighth {IEEE} International Working Conference on Source Code Analysis and Manipulation {(SCAM} 2008), 28-29 September 2008, Beijing, China, 2008. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{JiaH08,
author = {Yue Jia and Mark Harman},
title = {Constructing Subtle Faults Using Higher Order Mutation Testing},
booktitle = {Eighth {IEEE} International Working Conference on Source Code Analysis and Manipulation {(SCAM} 2008), 28-29 September 2008, Beijing, China},
year = {2008},
address = {},
month = {},
pages = {249--258}
} |
| 25 | Yue Jia and Mark Harman
Constructing Subtle Faults Using Higher Order Mutation Testing
Proceedings of the 8th International Working Conference on Source Code Analysis and Manipulation (SCAM'08)Beijing, China, 28-29 September 2008. |
|
| | Abstract: Traditional mutation testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easily killed. This paper investigates higher order mutants (HOMs). It introduces the concept of a subsuming HOM; one that is harder to kill than the first order mutants from which it is constructed. By definition, subsuming HOMs denote subtle fault combinations. The paper reports the results of an empirical study into subsuming HOMs, using six benchmark programs. This is the largest study of mutation testing to date. To overcome the exponential explosion in the number of mutants considered, the paper introduces a search based approach to the identification of subsuming HOMs. Results are presented for a greedy algorithm, a genetic algorithm and a hill climbing algorithm. |
| | @INPROCEEDINGS{JiaH08b,
author = {Yue Jia and Mark Harman},
title = {Constructing Subtle Faults Using Higher Order Mutation Testing},
booktitle = {Proceedings of the 8th International Working Conference on Source Code Analysis and Manipulation (SCAM'08)},
year = {2008},
address = {Beijing, China},
month = {28-29 September},
pages = {249-258}
} |
| 26 | Yue Jia and Mark Harman
MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language
Proceedings of the 3rd Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART'08)Windsor, UK, 29-31 August 2008. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{JiaH08a,
author = {Yue Jia and Mark Harman},
title = {MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language},
booktitle = {Proceedings of the 3rd Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART'08)},
year = {2008},
address = {Windsor, UK},
month = {29-31 August},
pages = {94-98}
} |
| 27 | Yue Jia and Mark Harman
MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language
Proceedings of the 3rd Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART'08)Windsor, UK, 29-31 August 2008. |
|
| | Abstract: This paper introduces MILU, a C mutation testing tool designed for both first order and higher order mutation testing. All previous mutation testing tools apply all possible mutation operators to the program under test. By contrast, MILU allows customization of the set of mutation operators to be applied. To reduce runtime cost, MILU uses a novel 'test harness' technique to embed mutants and their associated test sets into a single-invocation procedure. |
| | @INPROCEEDINGS{JiaH08a,
author = {Yue Jia and Mark Harman},
title = {MILU: A Customizable, Runtime-Optimized Higher Order Mutation Testing Tool for the Full C Language},
booktitle = {Proceedings of the 3rd Testing: Academic and Industrial Conference Practice and Research Techniques (TAIC PART'08)},
year = {2008},
address = {Windsor, UK},
month = {29-31 August},
pages = {94-98}
} |
