Mutation Testing Author

Name: Sten F. Andler
Affiliation: University of Skovde
Email: sten.f.andler@ida.his.se
Webpage:
1Birgitta Lindstr{\"{o}}m and Sten F. Andler and Jeff Offutt and Paul Pettersson and Daniel Sundmark
Mutating aspect-oriented models to test cross-cutting concerns
Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015, 2015.
BibTeX | Abstract | PDF | DOI
2Robert Nilsson and A. Jefferson Offutt and Sten F. Andler
Mutation-based Testing Criteria for Timeliness
Proceedings of the 28th Annual International Computer Software and Applications Conference (COMPSAC'04)Hong Kong, China, 28-30, September 2004.
BibTeX | Abstract | URL
3Robert Nilsson and Jeff Offutt and Sten F. Andler
Mutation-Based Testing Criteria for Timeliness
28th International Computer Software and Applications Conference {(COMPSAC} 2004), Design and Assessment of Trustworthy Software-Based Systems, 27-30 September 2004, Hong Kong, China, Proceedings, 2004.
BibTeX | Abstract | PDF | DOI