| 1 | Nan Li and Michael West and Anthony Escalona and Vinicius H. S. Durelli
Mutation testing in practice using Ruby
Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015, 2015. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{li_ICSTW_15,
author = {Nan Li and Michael West and Anthony Escalona and Vinicius H. S. Durelli},
title = {Mutation testing in practice using Ruby},
booktitle = {Eighth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2015 Workshops, Graz, Austria, April 13-17, 2015},
year = {2015},
address = {},
month = {},
pages = {1--6}
} |
| 2 | M{\'{a}}rcio Eduardo Delamaro and Lin Deng and Vinicius Humberto Serapilha Durelli and Nan Li and Jeff Offutt
Experimental Evaluation of {SDL} and One-Op Mutation for {C}
Seventh {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, {USA}, 2014. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DelamaroDDLO14,
author = {M{\'{a}}rcio Eduardo Delamaro and Lin Deng and Vinicius Humberto Serapilha Durelli and Nan Li and Jeff Offutt},
title = {Experimental Evaluation of {SDL} and One-Op Mutation for {C}},
booktitle = {Seventh {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, {USA}},
year = {2014},
address = {},
month = {},
pages = {203--212}
} |
| 3 | Lin Deng and Jeff Offutt and Nan Li
Empirical Evaluation of the Statement Deletion Mutation Operator
Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013, Luxembourg, Luxembourg, March 18-22, 2013, 2013. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{DengOL13,
author = {Lin Deng and Jeff Offutt and Nan Li},
title = {Empirical Evaluation of the Statement Deletion Mutation Operator},
booktitle = {Sixth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2013, Luxembourg, Luxembourg, March 18-22, 2013},
year = {2013},
address = {},
month = {},
pages = {84--93}
} |
| 4 | Jingyu Hu and Nan Li and Jeff Offutt
An Analysis of {OO} Mutation Operators
Fourth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings, 2011. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{HuLO11,
author = {Jingyu Hu and Nan Li and Jeff Offutt},
title = {An Analysis of {OO} Mutation Operators},
booktitle = {Fourth {IEEE} International Conference on Software Testing, Verification and Validation, {ICST} 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings},
year = {2011},
address = {},
month = {},
pages = {334--341}
} |
| 5 | Nan Li and Upsorn Praphamontripong and Jeff Offutt
An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-Uses and Prime Path Coverage
Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings, 2009. |
|
| | Abstract: Available soon... |
| | @INPROCEEDINGS{LiPO09,
author = {Nan Li and Upsorn Praphamontripong and Jeff Offutt},
title = {An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-Uses and Prime Path Coverage},
booktitle = {Second International Conference on Software Testing Verification and Validation, {ICST} 2009, Denver, Colorado, USA, April 1-4, 2009, Workshops Proceedings},
year = {2009},
address = {},
month = {},
pages = {220--229}
} |
| 6 | Nan Li and Upsorn Praphamontripong and A. Jefferson Offutt
An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-uses and Prime Path Coverage
Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)Denver, Colorado, 1-4 April 2009. |
|
| | Abstract: With recent increased expectations for quality, and the growth of agile processes and test driven development, developers are expected to do more and more effective unittesting. Yet, our knowledge of when to use the variousunit level test criteria is incomplete. The paper presentsresults from a comparison of four unit level software testing criteria. Mutation testing, prime path coverage, edgepair coverage, and all-uses testing were compared on twobases: the number of seeded faults found and the numberof tests needed to satisfy the criteria. The comparisonused a collection of Java classes taken from varioussources and hand-seeded faults. Tests were designed andgenerated mostly by hand with help from tools that computetest requirements and muJava. The findings are that mutationtests detected more faults and the other three criteriawere very similar. The paper also presents a secondarymeasure, a cost benefit ratio, computed as the number oftests needed to detect each fault. Surprisingly, mutation required the fewest number of tests. The paper also discusses some specific faults that were not found and presents analysis for why not. |
| | @INPROCEEDINGS{LiPO09,
author = {Nan Li and Upsorn Praphamontripong and A. Jefferson Offutt},
title = {An Experimental Comparison of Four Unit Test Criteria: Mutation, Edge-Pair, All-uses and Prime Path Coverage},
booktitle = {Proceedings of the 4th International Workshop on Mutation Analysis (MUTATION'09)},
year = {2009},
address = {Denver, Colorado},
month = {1-4 April},
pages = {220-229}
} |
