1 | A. Jefferson Offutt and Zhenyi Jin and Jie Pan The Dynamic Domain Reduction Procedure for Test Data Generation Software:Practice and Experience, 29(2), February 1999. |
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| Abstract: Test data generation is one of the most technically challenging steps of testing software, but most commercial systems currently incorporate very little automation for this step. This paper presents results from a project that is trying to find ways to incorporate test data generation into practical test processes. The results include a new procedure for automatically generating test data that incorporates ideas from symbolic evaluation, constraint-based testing, and dynamic test data generation. It takes an initial set of values for each input, and dynamically ‘pushes’ the values through the control-flow graph of the program, modifying the sets of values as branches in the program are taken. The result is usually a set of values for each input parameter that has the property that any choice from the sets will cause the path to be traversed. This procedure uses new analysis techniques, offers improvements over previous research results in constraint-based testing, and combines several steps into one coherent process. The dynamic nature of this procedure yields several benefits. Moving through the control flow graph dynamically allows path constraints to be resolved immediately, which is more efficient both in space and time, and more often successful than constraint-based testing. This new procedure also incorporates an intelligent search technique based on bisection. The dynamic nature of this procedure also allows certain improvements to be made in the handling of arrays, loops, and expressions; language features that are traditionally difficult to handle in test data generation systems. The paper presents the test data generation procedure, examples to explain the working of the procedure, and results from a proof-of-concept implementation. |
| @ARTICLE{OffuttJP99,
author = {A. Jefferson Offutt and Zhenyi Jin and Jie Pan},
title = {The Dynamic Domain Reduction Procedure for Test Data Generation},
journal = {Software:Practice and Experience},
year = {1999},
month = {February},
volume = {29},
number = {2},
pages = {167-193}
} |
2 | A. Jefferson Offutt and Jie Pan Automatically Detecting Equivalent Mutants and Infeasible Paths Software Testing, Verification and Reliability, 7(3), September 1997. |
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| Abstract: Mutation testing is a technique for testing software units that has great potential for improving the quality of testing, and thereby increasing our ability to assure the high reliability of critical software. It will be shown that recent advances in mutation research have brought a practical mutation testing system closer to reality. One recent advance is a partial solution to the problem of automatically detecting equivalent mutant programs. Equivalent mutants are currently detected by hand, which makes it very expensive and time-consuming. The problem of detecting equivalent mutants is a specific instance of a more general problem, commonly called the feasible path problem, which says that for certain structural testing criteria some of the test requirements are infeasible in the sense that the semantics of the program imply that no test case satisfies the test requirements. Equivalent mutants, unreachable statements in path testing techniques, and infeasible DU-pairs in data flow testing are all instances of the feasible path problem. This paper presents a technique that uses mathematical constraints, originally developed for test data generation, to automatically detect some equivalent mutants and infeasible paths. |
| @ARTICLE{OffuttP97,
author = {A. Jefferson Offutt and Jie Pan},
title = {Automatically Detecting Equivalent Mutants and Infeasible Paths},
journal = {Software Testing, Verification and Reliability},
year = {1997},
month = {September},
volume = {7},
number = {3},
pages = {165-192}
} |
3 | A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang An Experimental Evaluation of Data Flow and Mutation Testing Softw., Pract. Exper., 26(2), 1996. |
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| Abstract: Available soon... |
| @ARTICLE{OffuttPTZ96,
author = {A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang},
title = {An Experimental Evaluation of Data Flow and Mutation Testing},
journal = {Softw., Pract. Exper.},
year = {1996},
month = {},
volume = {26},
number = {2},
pages = {165--176}
} |
4 | A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang An Experimental Evaluation of Data Flow and Mutation Testing Software:Practice and Experience, 26(2), February 1996. |
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| Abstract: Two experimental comparisons of data flow and mutation testing are presented. These techniques are widely considered to be effective for unit-level software testing, but can only be analytically compared to a limited extent. We compare the techniques by evaluating the effectiveness of test data developed for each. We develop ten independent sets of test data for a number of programs: five to satisfy the mutation criterion and five to satisfy the all-uses data-flow criterion. These test sets are developed using automated tools, in a manner consistent with the way a test engineer might be expected to generate test data in practice. We use these test sets in two separate experiments. First we measure the effectiveness of the test data that was developed for one technique in terms of the other. Second, we investigate the ability of the test sets to find faults. We place a number of faults into each of our subject programs, and measure the number of faults that are detected by the test sets. Our results indicate that while both techniques are effective, mutation-adequate test sets are closer to satisfying the data flow criterion, and detect more faults. |
| @ARTICLE{OffuttPTZ96,
author = {A. Jefferson Offutt and Jie Pan and Kanupriya Tewary and Tong Zhang},
title = {An Experimental Evaluation of Data Flow and Mutation Testing},
journal = {Software:Practice and Experience},
year = {1996},
month = {February},
volume = {26},
number = {2},
pages = {165-176}
} |
5 | A. Jefferson Offutt and Jie Pan Detecting Equivalent Mutants and the Feasible Path Problem Proceedings of the 1996 Annual Conference on Computer AssuranceGaithersburg, Maryland, June 1996. |
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| Abstract: Available soon... |
| @INPROCEEDINGS{OffuttP96,
author = {A. Jefferson Offutt and Jie Pan},
title = {Detecting Equivalent Mutants and the Feasible Path Problem},
booktitle = {Proceedings of the 1996 Annual Conference on Computer Assurance},
year = {1996},
address = {Gaithersburg, Maryland},
month = {June},
pages = {224-236}
} |
6 | Jie Pan Using Constraints to Detect Equivalent Mutants George Mason University, Fairfax VA, 1994. |
|
| Abstract: Available soon... |
| @MASTERSTHESIS{Pan94,
author = {Jie Pan},
title = {Using Constraints to Detect Equivalent Mutants},
school = {George Mason University},
year = {1994},
type = {mastersthesis},
address = {Fairfax VA},
month = {},
} |
7 | A. Jefferson Offutt and Zhenyi Jin and Jie Pan The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms George Mason UniversityISSE-TR-94-110, Fairfax, Virginia, 1994. |
|
| Abstract: Available soon... |
| @TECHREPORT{OffuttJP94,
author = {A. Jefferson Offutt and Zhenyi Jin and Jie Pan},
title = {The Dynamic Domain Reduction Approach for Test Data Generation: Design and Algorithms},
institution = {George Mason University},
year = {1994},
type = {techreport},
number = {ISSE-TR-94-110},
address = {Fairfax, Virginia},
month = {},
} |