Name: | Eunhee Kim |
Affiliation: | Samsung Electronics Co. Ltd |
Email: | eunhee2.kim@samsung.com |
Webpage: |
1 | Hoijin Yoon and Eunhee Kim and Joo Young Seo and Byoungju Choi Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)Linz, Austria, 21 September 2005. |
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