Mutation Testing Author

Name: Eunhee Kim
Affiliation: Samsung Electronics Co. Ltd
1Hoijin Yoon and Eunhee Kim and Joo Young Seo and Byoungju Choi
Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study
Proceedings of the 4th International Workshop on Formal Approaches to Software Testing (FATES'04)Linz, Austria, 21 September 2005.
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