1 | Youssef Serrestou and Vincent Beroulle and Chantal Robach Functional Verification of RTL Designs Driven by Mutation Testing Metrics Proceedings of the 10th Euromicro Conference on Digital System Design Architectures, Methods and ToolsLubeck, Germany, 29-31 August 2007. |
|
| Abstract: The level of confidence in a VHDL description directly depends on the quality of its verification. This quality can be evaluated by mutation-based test, but the improvement of this quality requires tremendous efforts. In this paper, we propose a new approach that both qualifies and improves the functional verification process. First, we qualify test cases thanks to the mutation testing metrics: faults are injected in the design under verification (DUV) (making DUV's mutants) to check the capacity of test cases to detect theses mutants. Then, a heuristic is used to automatically improve IPs validation data. Experimental results obtained on RTL descriptions from ITC'99 benchmark show how efficient is our approach. |
| @INPROCEEDINGS{SerrestouBR07b,
author = {Youssef Serrestou and Vincent Beroulle and Chantal Robach},
title = {Functional Verification of RTL Designs Driven by Mutation Testing Metrics},
booktitle = {Proceedings of the 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools},
year = {2007},
address = {Lubeck, Germany},
month = {29-31 August},
pages = {222-227}
} |
2 | Youssef Serrestou and Vincent Beroulle and Chantal Robach Impact of Hardware Emulation on the Verification Quality Improvement Proceedings of the IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip (VLSI-SoC'07)Atlanta, GA, 15-17 October 2007. |
|
| Abstract: Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is the functional qualification; the second one is the qualification- driven stimuli generation. Currently, the qualification and the generation tasks are iterative processes based on VHDL simulation which is dramatically time consuming. The simulation time increases with the circuits’ size and the required level of quality. In our previous works, we have proposed some approaches based on the mutation testing technique to evaluate and to improve functional validation quality. Now, to reduce this simulation time, we propose in this paper a new approach based on FPGA emulation. So, an hardware-software platform called “Meta-Mutant Testbench” is used to emulate mutants. Experimental results for some ITC’99 benchmark circuits show that our mutation emulator is about 20 times faster than classical software simulators; this speedup increases with the circuits’ size. |
| @INPROCEEDINGS{SerrestouBR07a,
author = {Youssef Serrestou and Vincent Beroulle and Chantal Robach},
title = {Impact of Hardware Emulation on the Verification Quality Improvement},
booktitle = {Proceedings of the IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip (VLSI-SoC'07)},
year = {2007},
address = {Atlanta, GA},
month = {15-17 October},
pages = {218-223}
} |
3 | Huy Vu Do and Chantal Robach and Michel Delaunay Mutation Analysis for Reactive System Environment Properties Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)Raleigh, North Carolina, November 2006. |
|
| Abstract: Reactive systems used in safety-critical domains demand high level of confidence. The development of these systems, which are submitted to several normative recommendations, is complex and expensive. Reactive systems can be developed by using the data-flow approach: many languages support this approach such as MATLAB/SlMULINK, LUSTRE/SCADE. This paper concentrates on the LUSTRE/SCADE language, especially the description of reactive system environment properties in this language. The description of environment properties, which is important for the validation (the proof and the test) of reactive systems, is not easy. Hence, we would like to use the mutation technique to consolidate this difficult task: we use the LESAR model-checking tool to detect equivalent mutants and some test case generators such as GATEL or LUTESS tools to kill non-equivalent mutants. |
| @INPROCEEDINGS{DoRD06,
author = {Huy Vu Do and Chantal Robach and Michel Delaunay},
title = {Mutation Analysis for Reactive System Environment Properties},
booktitle = {Proceedings of the 2nd Workshop on Mutation Analysis (MUTATION'06)},
year = {2006},
address = {Raleigh, North Carolina},
month = {November},
pages = {2}
} |
4 | Youssef Serrestou and Vincent Beroulle and Chantal Robach How to Improve a Set of Design Validation Data by Using Mutation-Based Test Proceedings of the IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS'06)Prague, Czech Republic, 18-21 April 2006. |
|
| Abstract: In current hardware design flow, functional verification is widely acknowledged as the crucial step. This paper presents a new contribution to reduce the cost of this step by automating it. We address here, one of the principal challenges of dynamic verification, by providing a new approach for automatic test generation. This approach combines mutation-based test techniques and genetic algorithms to produce stimuli for design under test. The feasibility of the proposed approach is assessed with a preliminary implementation, and some framework has been tested |
| @INPROCEEDINGS{SerrestouBR06,
author = {Youssef Serrestou and Vincent Beroulle and Chantal Robach},
title = {How to Improve a Set of Design Validation Data by Using Mutation-Based Test},
booktitle = {Proceedings of the IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS'06)},
year = {2006},
address = {Prague, Czech Republic},
month = {18-21 April},
pages = {75-76}
} |
5 | Mathieu Scholive and Vincent Beroulle and Chantal Robach and M. L. Flottes and B. Rouzeyre Mutation Sampling Technique for the Generation of Structural Test Data Proceedings of the Conference on Design, Automation and Test in Europe (DATE'05)Munich, Germany,, 7-11 March 2005. |
|
| Abstract: Available soon... |
| @INPROCEEDINGS{ScholivBRFR05,
author = {Mathieu Scholive and Vincent Beroulle and Chantal Robach and M. L. Flottes and B. Rouzeyre},
title = {Mutation Sampling Technique for the Generation of Structural Test Data},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe (DATE'05)},
year = {2005},
address = {Munich, Germany,},
month = {7-11 March},
pages = {1022 - 1023}
} |