Mutation Testing Author

Name: Chang-ai Sun
Affiliation: Swinburne University of Technology
1Chang-ai Sun and Yunwei Dong and Richard Lai and K. Y. Sim and T. Y. Chen
Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions
Proceedings of the 6th IEEE International Conference on Computer and Information TechnologySeoul, Korea, 20-22 September 2006.
BibTeX | Abstract | URL